Cor Claeys - Publications, H-index & Citations

Impact of Fe and Cu contamination on the minority carrier lifetime of silicon substrates

IF3.3

2019-12-06

PREAI

Rotondaro, ALP; Bender, H; Heyns, MM; Claeys, C

Processes in ultrathin buried bride synthesis stimulated by low dose ion implantation

IF3.3

2019-12-06

PREAI

Rotondaro, ALP; Hurd, TQ; Kaniava, A; Vanhellemont, J; Simoen, E; Heyns, MM; Claeys, C

Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics

IF3.3

2019-12-06

PREAI

Litovchenko, VG; Efremov, AA; Romanyuk, BN; Mel'nik, VP; Claeys, C

Special Focus on Advanced Microelectronics Technology

IF3.3

2019-12-06

PREAI

Claeys, C; Simoen, E; Poyai, A; Czerwinski, A

SCIENCE CHINA-INFORMATION SCIENCES

IF7.6

2016-07-20

OAAI

Huang, Ru; Iwai, Hiroshi; Claeys, Cor; Deleonibus, Simon; Wang, Runsheng

Impact of carbon-doping on time dependent dielectric breakdown of SiO2-based films

Challenges and opportunities in advanced Ge pMOSFETs

IF3.6

2015-02-19

PREAI

Zhao, Larry; Barbarin, Yohan; Croes, Kristof; Baklanov, Mikhail R.; Verdonck, Patrick; Tokei, Zsolt; Claeys, Cor

Uniaxial and/or Biaxial Strain Influence on MuGFET Devices

IF4.6

2012-12-01

PREAI

Simoen, E.; Mitard, J.; Hellings, G.; Eneman, G.; De Jaeger, B.; Witters, L.; Vincent, B.; Loo, R.; Delabie, A.; Sioncke, S.; Caymax, M.; Claeys, C.

Study of ohmic contacts to n-type Ge: Snowplow and laser activation

IF3.3

2012-01-01

PREAI

Agopian, P. G. D.; Martino, J. A.; Simoen, E.; Claeys, C.

Role of copper in time dependent dielectric breakdown of porous organo-silicate glass low-k materials

IF3.6

2011-12-13

PREAI

Firrincieli, A.; Martens, K.; Rooyackers, R.; Vincent, B.; Rosseel, E.; Simoen, E.; Geypen, J.; Bender, H.; Claeys, C.; Kittl, J. A.

Direct observation of the 1/E dependence of time dependent dielectric breakdown in the presence of copper

IF3.6

2011-12-01

OAAI

Zhao, Larry; Pantouvaki, Marianna; Croes, Kristof; Tokei, Zsolt; Barbarin, Yohan; Wilson, Christopher J.; Baklanov, Mikhail R.; Beyer, Gerald P.; Claeys, Cor

Mechanisms of Oxygen Precipitation in Cz-Si Wafers Subjected to Rapid Thermal Anneals

IF3.6

2011-01-17

PREAI

Zhao, Larry; Tokei, Zsolt; Croes, Kristof; Wilson, Christopher J.; Baklanov, Mikhail; Beyer, Gerald P.; Claeys, Cor

FISH SOI MOSFET: Modeling, Characterization and Its Application to Improve the Performance of Analog ICs

IF3.3

2011-01-01

PREAI

Sarikov, Andrey; Litovchenko, Vladimir; Lisovskyy, Igor; Voitovich, Maria; Zlobin, Sergei; Kladko, Vasyl; Slobodyan, Nikolay; Machulin, Vladimir; Claeys, Cor

Extended-Defect Aspects of Ge-on-Si Materials and Devices

IF3.3

2011-01-01

PREAI

Gimenez, Salvador Pinillos; Alati, Daniel Manha; Simoen, Eddy; Claeys, Cor

Radiation damage of Ge-on-Si devices

IF3.3

2010-01-01

OAAI

Simoen, E.; Eneman, G.; Wang, G.; Souriau, L.; Loo, R.; Caymax, M.; Claeys, C.

E-MRS 2008 Spring Conference Symposium J: Beyond Silicon Technology: Materials and Devices for Post-Si CMOS Preface

IF4.6

2008-10-01

PREAI

Ohyama, H.; Sakamoto, K.; Sukizaki, H.; Takakura, K.; Hayama, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; De Jaeger, B.; Simoen, E.; Claeys, C.

Effects of electron and proton irradiation on embedded SiGe source/drain diodes

IF4.6

2008-10-01

PREAI

Claeys, Cor; Peaker, Tony; Fompeyrine, Jean; Frank, Martin; Vanhellemont, Jan

Leakage current study of Si1-xCx embedded source/drain junctions

IF4.6

2008-10-01

PREAI

Ohyama, H.; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Midorikawa; Kuboyama, S.; Gonzalez, M. B.; Simoen, E.; Claeys, C.

APPLIED SURFACE SCIENCE

IF6.9

2008-07-01

PREAI

Simoen, E.; Vissouvanadin, B.; Taleb, N.; Gonzalez, M. Bargallo; Verheyen, P.; Loo, R.; Claeys, C.; Machkaoutsan, V.; Bauer, M.; Thomas, S.; Lu, J. P.; Wise, R.

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack

Processing factors impacting the leakage current and flicker noise of germanium p+-n junctions on silicon substrates

IF3.6

2008-04-24

PREAI

Maji, Debabrata; Crupi, Felice; Giusi, Gino; Pace, Calogero; Simoen, Eddy; Claeys, Cor; Rao, V. Ramgopal