Kyeongtae Kim - Publications & Citations

Kyeongtae Kim

university of michigan system

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收录论文 8

发表时间

Quantification of thermal and contact resistances of scanning thermal probes

APPLIED PHYSICS LETTERS

IF3.6

2014-11-20

OAAI

Kim, Kyeongtae; Jeong, Wonho; Lee, Woochul; Sadat, Seid; Thompson, Dakotah; Meyhofer, Edgar; Reddy, Pramod

Characterization of nanoscale temperature fields during electromigration of nanowires (vol 4, 4975, 2014)

SCIENTIFIC REPORTS

IF3.9

2014-07-16

OAAI

Jeong, Wonho; Kim, Kyeongtae; Kim, Youngsang; Lee, Woochul; Reddy, Pramod

Characterization of nanoscale temperature fields during electromigration of nanowires

SCIENTIFIC REPORTS

IF3.9

2014-05-15

OAAI

Jeong, Wonho; Kim, Kyeongtae; Kim, Youngsang; Lee, Woochul; Reddy, Pramod

Quantitative Thermopower Profiling across a Silicon p-n Junction with Nanometer Resolution

NANO LETTERS

IF9.1

2012-08-16

PREAI

Lee, Byeonghee; Kim, Kyeongtae; Lee, Seungkoo; Kim, Jong Hoon; Lim, Dae Soon; Kwon, Ohmyoung; Lee, Joon Sik

Ultra-High Vacuum Scanning Thermal Microscopy for Nanometer Resolution Quantitative Thermometry 超高真空扫描热显微镜用于纳米分辨率定量测温

ACS NANO

IF16

2012-05-02

180

PREAI

Kim, Kyeongtae; Jeong, Wonho; Lee, Woochul; Reddy, Pramod

Quantitative Measurement with Scanning Thermal Microscope by Preventing the Distortion Due to the Heat Transfer through the Air 通过扫描热显微镜进行定量测量，防止由于空气传热而导致的失真

ACS NANO

IF16

2011-10-19

121

PREAI

Kim, Kyeongtae; Chung, Jaehun; Hwang, Gwangseok; Kwon, Ohmyoung; Lee, Joon Sik

Quantitative scanning thermal microscopy using double scan technique

APPLIED PHYSICS LETTERS

IF3.6

2008-11-20

PREAI

Kim, Kyeongtae; Chung, Jaehoon; Won, Jongbo; Kwon, Ohmyoung; Lee, Joon Sik; Park, Seung Ho; Choi, Young Ki

Thermopower profiling of a silicon p-n junction

APPLIED PHYSICS LETTERS

IF3.6

2007-01-23

PREAI

Kim, Kyeongtae; Park, Jisang; Kim, Sun Ung; Kwon, Ohmyoung; Lee, Joon Sik; Park, Seungho Ho; Choi, Young Ki

研究方向