Thomas Hantschel - Publications & Citations

Thomas Hantschel

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收录论文 15

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Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy 尖锐导电金刚石探针芯片的纳米制造及其在反向探针样品扫描探针显微镜中的应用

Micro and Nano Engineering

IF3.1

2025-07-05

OAAI

L. Wouters; J. Cho; S. Gim; J. Yang; A. Kanniainen; K. Lee; P. Lagrain; N. Peric; T. Hantschel

The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements

SCIENTIFIC REPORTS

IF3.9

2020-09-10

OAAI

Pandey, Komal; Paredis, Kristof; Hantschel, Thomas; Drijbooms, Chris; Vandervorst, Wilfried

Synthesis and characterization of boron doped diamond/β-SiC composite films

APPLIED PHYSICS LETTERS

IF3.6

2017-01-17

PREAI

Fu, Haiyuan; Zhuang, Hao; Yang, Liang; Hantschel, Thomas; Ma, Song; Zhang, Zhidong; Jiang, Xin

Advanced Raman Spectroscopy Using Nanofocusing of Light

ADVANCED ENGINEERING MATERIALS

IF3.3

2017-01-13

PREAI

Nuytten, Thomas; Bogdanowicz, Janusz; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried

Effect of Boron Doping on the Wear Behavior of the Growth and Nucleation Surfaces of Micro- and Nanocrystalline Diamond Films

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2016-09-20

OAAI

Buijnsters, Josephus G.; Tsigkourakos, Menelaos; Hantschel, Thomas; Gomes, Francis O. V.; Nuytten, Thomas; Favia, Paola; Bender, Hugo; Arstila, Kai; Celis, Jean-Pierre; Vandervorst, Wilfried

Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels

APPLIED PHYSICS LETTERS

IF3.6

2015-01-22

PREAI

Nuytten, T.; Hantschel, T.; Kosemura, D.; Schulze, A.; De Wolf, I.; Vandervorst, W.

Diameter-dependent boron diffusion in silicon nanowire-based transistors

APPLIED PHYSICS LETTERS

IF3.6

2013-02-05

PREAI

Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne S.; Rooyackers, Rita; Vandooren, Anne; Vandervorst, W.

pT-effects of Pleistocene glacial periods on permafrost, gas hydrate stability zones and reservoir of the Mittelplate oil field, northern Germany

MARINE AND PETROLEUM GEOLOGY

IF3.6

2010-01-01

PREAI

Grassmann, S.; Cramer, B.; Delisle, G.; Hantschel, T.; Messner, J.; Winsemann, J.

Stressed metal probes for atomic force microscopy

APPLIED PHYSICS LETTERS

IF3.6

2002-10-14

PREAI

Hantschel, T; Chow, EM; Rudolph, D; Fork, DK

Three-dimensional carrier profiling of InP-based devices using scanning spreading resistance microscopy

APPLIED PHYSICS LETTERS

IF3.6

2002-07-01

PREAI

Xu, MW; Hantschel, T; Vandervorst, W

Towards sub-10 nm carrier profiling with spreading resistance techniques

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2001-02-01

PREAI

Clarysse, T; Eyben, P; Hantschel, T; Vandervorst, W

Finite element analysis and ray tracing modeling of petroleum migration 石油运移的有限元分析和射线追踪建模

MARINE AND PETROLEUM GEOLOGY

IF3.6

2000-08-01

PREAI

Hantschel, T; Kauerauf, AI; Wygrala, B

Aspects of petroleum migration modelling 石油运移建模的各个方面

JOURNAL OF GEOCHEMICAL EXPLORATION

IF3.3

2000-06-01

PREAI

Welte, DH; Hantschel, T; Wygrala, BP; Weissenburger, KS; Carruthers, D

Highly conductive diamond probes for scanning spreading resistance microscopy

APPLIED PHYSICS LETTERS

IF3.6

2000-03-20

PREAI

Hantschel, T; Niedermann, P; Trenkler, T; Vandervorst, W

Two-dimensional carrier profiling of InP structures using scanning spreading resistance microscopy

APPLIED PHYSICS LETTERS

IF3.6

1998-10-12

PREAI

De Wolf, P; Geva, M; Hantschel, T; Vandervorst, W; Bylsma, RB

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