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J

J. Itoh

机构信息待补充

24H指数
258论文数
2.5K被引数
收录论文 23
发表时间
Anisotropic s-wave superconductors studied by angle-resolved photoemission spectroscopy
err2006-01-01
err11
PREAI
errYokoya, T; Baba, T; Tsuda, S; Kiss, T; Chainani, A; Shin, S; Watanabe, T; Nohara, M; Hanaguri, T; Takagi, H; Takano, Y; Kito, H; Itoh, J; Harima, H; Oguchi, T
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Superconducting properties of the 18 K phase in yttrium sesquicarbide system
err2004-04-12
err25
PREAI
errNakane, T; Mochiku, T; Kito, H; Itoh, J; Nagao, M; Kumakura, H; Takano, Y
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Doping diagnosis by evaluation of the surface Fermi level using scanning Maxwell-stress microscopy
err2003-03-31
err6
PREAI
errMatsukawa, T; Kanemaru, S; Masahara, M; Nagao, M; Tanoue, H; Itoh, J
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Metal-insulator-vacuum type electron emission from N-containing chemical vapor deposited diamond
err2001-07-09
err44
PREAI
errOkano, K; Yamada, T; Sawabe, A; Koizumi, S; Itoh, J; Amaratunga, GAJ
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Predictive model for scanned probe oxidation kinetics
err2000-05-08
err108
errOAAI
errDagata, JA; Perez-Murano, F; Abadal, G; Morimoto, K; Inoue, T; Itoh, J; Yokoyama, H
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Potential profile between boron-doped diamond electron emitter and anode electrode
err2000-03-06
err30
PREAI
errYamada, T; Sawabe, A; Koizumi, S; Itoh, J; Okano, K
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Air-bridge-structured silicon nanowire and anomalous conductivity
err1999-12-20
err33
PREAI
errFujii, H; Kanemaru, S; Matsukawa, T; Itoh, J
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Fabrication and characterization of a nanogap edge emitter with a silicon-on-insulator wafer
err1999-05-01
err17
PREAI
errFujii, H; Kanemaru, S; Hiroshima, H; Gorwadkar, SM; Matsukawa, T; Itoh, J
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Field emission from flat metal surfaces covered with Ba atoms
err1999-05-01
err12
PREAI
errOzawa, R; Kaykham, K; Hiraishi, A; Suzuki, Y; Mori, N; Yaguchi, T; Itoh, J; Yamamoto, S
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Electron field emission from semiconductors through oxide layers: possible transport effects
err1999-05-01
err4
PREAI
errFilip, V; Nicolaescu, D; Okuyama, F; Plavitu, CN; Itoh, J
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Formation of backcontacts on diamond electron emitters
err1999-05-01
err4
PREAI
errYamada, T; Sawabe, A; Koizumi, S; Itoh, J; Okano, K
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Atomic level analysis of electron emitter surfaces by the scanning atom probe
err1999-05-01
err14
PREAI
errNishikawa, O; Maeda, K; Ohtani, Y; Watanabe, M; Tanaka, K; Sekine, T; Iwatsuki, M; Aoki, S; Itoh, J; Yamanaka, K
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Modeling of a pressure sensor based on an array of wedge emitters
err1999-05-01
err10
PREAI
errMarqués, MI; Serena, PA; Nicolaescu, D; Itoh, J
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Understanding scanned probe oxidation of silicon
err1998-07-13
err113
PREAI
errDagata, JA; Inoue, T; Itoh, J; Yokoyama, H
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