M. Skibowski - Publications, H-index & Citations

M. Skibowski

机构信息待补充

40H指数

215论文数

5.4K被引数

收录论文 18

发表时间

Contributions of the escape depth to the photoelectron intensity of a well-defined initial state

PHYSICAL REVIEW B

IF3.7

2004-08-25

OAAI

Morgenstern, M; Strasser, T; Adelung, R; Getzlaff, M; Kipp, L; Skibowski, M; Schattke, W; Wiesendanger, R

Valence and conduction band states of HfS2:: From bulk to a single layer -: art. no. 235331

PHYSICAL REVIEW B

IF3.7

2003-12-31

PREAI

Kreis, C; Werth, S; Adelung, R; Kipp, L; Skibowski, M; Krasovskii, EE; Schattke, W

Self-assembled nanowire networks by deposition of copper onto layered-crystal surfaces

ADVANCED MATERIALS

IF26.8

2002-08-05

PREAI

Adelung, R; Ernst, F; Scott, A; Tabib-Azar, M; Kipp, L; Skibowski, M; Hollensteiner, S; Spiecker, E; Jäger, W; Gunst, S; Klein, A; Jägermann, W; Zaporojtchenko, V; Faupel, F

Charge-density-wave phase transition in 1T-TiSe2:: Excitonic insulator versus band-type Jahn-Teller mechanism -: art. no. 235101

PHYSICAL REVIEW B

IF3.7

2002-05-21

178

PREAI

Rossnagel, K; Kipp, L; Skibowski, M

Surface resonances at transition metal dichalcogenide heterostructures -: art. no. 153314

PHYSICAL REVIEW B

IF3.7

2002-04-04

PREAI

Kreis, C; Werth, S; Adelung, R; Kipp, L; Skibowski, M; Voss, D; Krüger, P; Mazur, A; Pollmann, J

Fermi surface of 2H-NbSe2 and its implications on the charge-density-wave mechanism -: art. no. 235119

PHYSICAL REVIEW B

IF3.7

2001-11-28

109

PREAI

Rossnagel, K; Seifarth, O; Kipp, L; Skibowski, M; Voss, D; Krüger, P; Mazur, A; Pollmann, J

Reconfiguration of charge density waves by surface nanostructures on TaS2 -: art. no. 165327

PHYSICAL REVIEW B

IF3.7

2001-04-06

OAAI

Adelung, R; Brandt, J; Kipp, L; Skibowski, M

Structural properties of chlorinated epitaxial C60 films -: art. no. 155401

PHYSICAL REVIEW B

IF3.7

2001-03-22

PREAI

Woedtke, S; Meeder, A; Adelung, R; Schwedhelm, R; Kipp, L; Skibowski, M

Three-dimensional Fermi surface determination by angle-resolved photoelectron spectroscopy -: art. no. 125104

PHYSICAL REVIEW B

IF3.7

2001-03-07

OAAI

Rossnagel, K; Kipp, L; Skibowski, M; Solterbeck, C; Strasser, T; Schattke, W; Voss, D; Krüger, P; Mazur, A; Pollmann, J

Combined photoemission and inverse photoemission study of HfS2 -: art. no. 035107

PHYSICAL REVIEW B

IF3.7

2001-01-02

OAAI

Traving, M; Seydel, T; Kipp, L; Skibowski, M; Starrost, F; Krasovskii, EE; Perlov, A; Schattke, W

Tracing the valence band maximum during epitaxial growth of HfS2 on WSe2

APPLIED SURFACE SCIENCE

IF6.9

2000-10-01

PREAI

Kreis, C; Traving, M; Adelung, R; Kipp, L; Skibowski, M

Charge density waves affected by Rb nanowire network formation on 1T-TaS2

APPLIED SURFACE SCIENCE

IF6.9

2000-08-01

PREAI

Adelung, R; Brandt, J; Tarcak, L; Kipp, L; Skibowski, M

Nanowire networks on perfectly flat surfaces

APPLIED PHYSICS LETTERS

IF3.6

1999-05-17

PREAI

Adelung, R; Kipp, L; Brandt, J; Tarcak, L; Traving, M; Kreis, C; Skibowski, M

Epitaxial thin-film growth of C60 on VSe2 studied with scanning tunneling microscopy and x-ray diffraction

PHYSICAL REVIEW B

IF3.7

1999-05-15

OAAI

Schwedhelm, R; Schlomka, JP; Woedtke, S; Adelung, R; Kipp, L; Tolan, M; Press, W; Skibowski, M

Extrinsic surface states traced by surface photovoltage in photoemission

APPLIED PHYSICS LETTERS

IF3.6

1999-03-29

PREAI

Kipp, L; Adelung, R; Wrobel, NT; Skibowski, M

Band bending, surface photovoltage and tunnelling microscopy on WSe2:Rb

APPLIED SURFACE SCIENCE

IF6.9

1998-01-01

PREAI

Boehme, M; Adelung, R; Traving, M; Kipp, L; Skibowski, M

Electronic structure of WSe2: A combined photoemission and inverse photoemission study

PHYSICAL REVIEW B

IF3.7

1997-04-15

PREAI

Traving, M; Boehme, M; Kipp, L; Skibowski, M; Starrost, F; Krasovskii, EE; Perlov, A; Schattke, W

Complete band-structure determination of the quasi-two-dimensional Fermi-liquid reference compound TiTe2

PHYSICAL REVIEW B

IF3.7

1996-07-15

PREAI

Claessen, R; Anderson, RO; Gweon, GH; Allen, JW; Ellis, WP; Janowitz, C; Olson, CG; Shen, ZX; Eyert, V; Skibowski, M; Friemelt, K; Bucher, E; Hufner, S

研究方向