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M

Mathias Nagel

eberhard karls university of tubingen

14H指数
48论文数
637被引数
收录论文 9
发表时间
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From drop-shape analysis to stress-fitting elastometry从滴形分析到应力拟合弹性测量
errADVANCES IN COLLOID AND INTERFACE SCIENCE
IF19.3
err2017-09-01
err70
errOAAI
errNagel, Mathias; Tervoort, Theo A.; Vermant, Jan
err分享
err收藏
A numerical study of droplet trapping in microfluidic devices
errPHYSICS OF FLUIDS
IF4.3
err2014-03-12
err23
errOAAI
errNagel, Mathias; Brun, P-T; Gallaire, Francois
err分享
err收藏
A new prediction of wavelength selection in radial viscous fingering involving normal and tangential stresses涉及法向和切向应力的径向粘性指法中波长选择的新预测
errPHYSICS OF FLUIDS
IF4.3
err2013-12-20
err28
errOAAI
errNagel, Mathias; Gallaire, Francois
err分享
err收藏
Photoemission electron microscopy of diindenoperylene thin films
errPHYSICAL REVIEW B
IF3.7
err2008-08-13
err17
PREAI
errCasu, M. B.; Biswas, I.; Nagel, M.; Nagel, P.; Schuppler, S.; Chasse, T.
err分享
err收藏
Molecular orientation in diindenoperylene thin films deposited on polycrystalline gold
errAPPLIED PHYSICS LETTERS
IF3.6
err2008-07-14
err23
PREAI
errCasu, M. B.; Biswas, I.; Schuster, B. -E.; Nagel, M.; Nagel, P.; Schuppler, S.; Chasse, T.
err分享
err收藏
Ultrathin transition-metal oxide films:: Thickness dependence of the electronic structure and local geometry in MnO
errPHYSICAL REVIEW B
IF3.7
err2007-05-18
err27
PREAI
errNagel, Mathias; Biswas, Indro; Nagel, Peter; Pellegrin, Eric; Schuppler, Stefan; Peisert, Heiko; Chasse, Thomas
err分享
err收藏
Buried interfacial layer of highly oriented molecules in copper phthalocyanine thin films on polycrystalline gold
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2007-05-01
err49
PREAI
errBiswas, Indro; Peisert, Heiko; Nagel, Mathias; Casu, Maria Benedetta; Schuppler, Stefan; Nagel, Peter; Pellegrin, Eric; Chasse, Thomas
err分享
err收藏
Film growth and interface reaction of ultra thin 3d-transition metal oxide/metal layer structures
errMICROCHIMICA ACTA
IF5.3
err2006-06-12
err3
PREAI
errNagel, Mathias; Zhang, Lei; Peisert, Heiko; Chasse, Thomas
err分享
err收藏
Chemical reactions at Cu/ZnS(001) and In/ZnS(001) heterojunctions:: A comparison of photoelectron and S L2,3 x-ray emission spectroscopy -: art. no. 012108
errAPPLIED PHYSICS LETTERS
IF3.6
err2004-12-27
err4
PREAI
errZhang, L; Wett, D; Schulze, D; Szargan, R; Nagel, M; Peisert, H; Chassé, T
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
J
Jan Vermant
H 指数: 67 · 论文数: 457
T
Thomas Chassé
H 指数: 40 · 论文数: 281
H
Heiko Peisert
H 指数: 39 · 论文数: 204
S
S. Schuppler
H 指数: 38 · 论文数: 255
T
Theo A. Tervoort
H 指数: 36 · 论文数: 128
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