Stephan J. Stranick - Publications, H-index & Citations

Stephan J. Stranick

national institute of standards & technology (nist) - usa

24H指数

100论文数

2.9K被引数

收录论文 15

发表时间

The Projectile Perforation Resistance of Materials: Scaling the Impact Resistance of Thin Films to Macroscale Materials 材料的抗射弹穿孔性: 将薄膜的抗冲击性扩展到宏观材料

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2023-06-29

PREAI

Evans, Katherine M.; Chen, Shawn H.; Souna, Amanda J.; Stranick, Stephan J.; Soles, Christopher L.; Chan, Edwin P.

Rapid Wafer-Scale Growth of Polycrystalline 2H-MoS2 by Pulsed Metal-Organic Chemical Vapor Deposition

CHEMISTRY OF MATERIALS

IF7

2017-07-25

OAAI

Kalanyan, Berc; Kimes, William A.; Beams, Ryan; Stranick, Stephan J.; Garret, Elias; Kalish, Irina; Davydov, Albert V.; Kanjolia, Ravindra K.; Maslar, James E.

Characterization of Few-Layer 1T′ MoTe2 by Polarization-Resolved Second Harmonic Generation and Raman Scattering 用偏振分辨二次谐波产生和拉曼散射表征少层1t ′ MoTe2

ACS NANO

IF16

2016-10-13

168

OAAI

Beams, Ryan; Cancado, Luiz Gustavo; Krylyuk, Sergiy; Kalish, Irina; Kalanyan, Berc; Singh, Arunima K.; Choudhary, Kamal; Bruma, Alina; Vora, Patrick M.; Tavazza, Francesca; Da-Vydov, Albert V.; Stranick, Stephan J.

Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy

APPLIED PHYSICS LETTERS

IF3.6

2014-05-15

PREAI

Myers, Grant A.; Hazra, Siddharth S.; de Boer, Maarten P.; Michaels, Chris A.; Stranick, Stephan J.; Koseski, Ryan P.; Cook, Robert F.; DelRio, Frank W.

Superresolution four-wave mixing microscopy

OPTICS EXPRESS

IF3.3

2012-02-28

OAAI

Kim, Hyunmin; Bryant, Garnett W.; Stranick, Stephan J.

Direct observation of phase transformation anisotropy in indented silicon studied by confocal Raman spectroscopy

PHYSICAL REVIEW B

IF3.7

2011-05-31

PREAI

Gerbig, Yvonne B.; Stranick, Stephan J.; Cook, Robert F.