J. Giérak - Publications, H-index & Citations

J. Giérak

Université Paris Saclay

29H指数

131论文数

3.2K被引数

收录论文 16

发表时间

Recent advances in adapting ionic liquid ion sources to focused ion beams technologies 近期在将离子液体离子源适配到聚焦离子束技术方面的最新进展

Micro and Nano Engineering

IF3.1

2026-08-01

PREAI

Berdague, Philippe; Lesot, Philippe; Bouville, David; Villebasse, Cedric; Gierak, Jacques

Comparison of technologies for nano device prototyping with a special focus on ion beams: A review

APPLIED PHYSICS REVIEWS

IF11.6

2017-01-20

OAAI

Bruchhaus, L.; Mazarov, P.; Bischoff, L.; Gierak, J.; Wieck, A. D.; Hoevel, H.

Liquid metal alloy ion sources-An alternative for focussed ion beam technology

APPLIED PHYSICS REVIEWS

IF11.6

2016-06-01

PREAI

Bischoff, Lothar; Mazarov, Paul; Bruchhaus, Lars; Gierak, Jacques

Dynamic fluctuations and two-dimensional melting at the spin reorientation transition

PHYSICAL REVIEW B

IF3.7

2012-09-25

PREAI

Bergeard, N.; Jamet, J. P.; Mougin, A.; Ferre, J.; Gierak, J.; Bourhis, E.; Stamps, R.

Nanostructuring graphene on SiC by focused ion beam: Effect of the ion fluence

APPLIED PHYSICS LETTERS

IF3.6

2011-08-22

PREAI

Prevel, B.; Benoit, J. -M.; Bardotti, L.; Melinon, P.; Ouerghi, A.; Lucot, D.; Bourhis, E.; Gierak, J.

Dynamics of Completely Unfolded and Native Proteins through Solid-State Nanopores as a Function of Electric Driving Force

ACS NANO

IF16

2011-04-26

195

PREAI

Oukhaled, Abdelghani; Cressiot, Benjamin; Bacri, Laurent; Pastoriza-Gallego, Manuela; Betton, Jean-Michel; Bourhis, Eric; Jede, Ralf; Gierak, Jacques; Auvray, Loic; Pelta, Juan

Focused ion beam micro- and nanoengineering

MRS BULLETIN

IF4.9

2011-01-31

PREAI

Langford, Richard M.; Nellen, Philipp M.; Gierak, Jacques; Fu, Yongqi

Epitaxial graphene on cubic SiC(111)/Si(111) substrate

APPLIED PHYSICS LETTERS

IF3.6

2010-05-14

101

OAAI

Ouerghi, A.; Kahouli, A.; Lucot, D.; Portail, M.; Travers, L.; Gierak, J.; Penuelas, J.; Jegou, P.; Shukla, A.; Chassagne, T.; Zielinski, M.

Surface morphology and characterization of thin graphene films on SiC vicinal substrate

PHYSICAL REVIEW B

IF3.7

2009-01-21

PREAI

Penuelas, J.; Ouerghi, A.; Lucot, D.; David, C.; Gierak, J.; Estrade-Szwarckopf, H.; Andreazza-Vignolle, C.

Efficient generation of surface plasmon by single-nanoslit illumination under highly oblique incidence

APPLIED PHYSICS LETTERS

IF3.6

2009-01-09

OAAI

Wang, B.; Aigouy, L.; Bourhis, E.; Gierak, J.; Hugonin, J. P.; Lalanne, P.

Production of a helium beam in a focused ion beam machine using an electron beam ion trap

APPLIED PHYSICS LETTERS

IF3.6

2007-02-19

PREAI

Ullmann, F.; Grossmann, F.; Ovsyannikov, V. P.; Gierak, J.; Zschornack, G.

Gold nanoparticle arrays on graphite surfaces

APPLIED SURFACE SCIENCE

IF6.9

2004-03-01

PREAI

Prével, B; Bardotti, L; Fanget, S; Hannour, A; Mélinon, P; Perez, A; Gierak, J; Faini, G; Bourhis, E; Mailly, D

STM and FIB nano-structuration of surfaces to localise InAs/InP(001) quantum dots STM和FIB表面纳米结构以定位InAs/InP(001) 量子点

APPLIED SURFACE SCIENCE

IF6.9

2004-03-01

PREAI

Kapsa, J; Robach, Y; Hollinger, G; Gendry, M; Gierak, J; Mailly, D

Organizing nanoclusters on functionalized surfaces

APPLIED SURFACE SCIENCE

IF6.9

2002-05-01

PREAI

Bardotti, L; Prével, B; Jensen, P; Treilleux, M; Mélinon, P; Perez, A; Gierak, J; Faini, G; Mailly, D

Power-law relaxation decay in two-dimensional arrays of magnetic dots interacting by long-range dipole-dipole interactions -: art. no. 184440

PHYSICAL REVIEW B

IF3.7

2001-10-25

PREAI

Sampaio, LC; Hyndman, R; de Menezes, FS; Jamet, JP; Meyer, P; Gierak, J; Chappert, C; Mathet, V; Ferré, J

Focused ion beam nanolithography on AlF3 at a 10 nm scale

APPLIED PHYSICS LETTERS

IF3.6

1997-04-14

PREAI

Gierak, J; Vieu, C; Launois, H; BenAssayag, G; Septier, A

研究方向