logo
科言猫学术研究的AI总结
language
手机端手机端
  • Phone Feature微信小程序
简体中文简体中文
notice消息通知
博客博客
delete
arrow
返回
P

Pei‐I Wang

rensselaer polytechnic institute

16H指数
61论文数
1.2K被引数
收录论文 16
发表时间
logo
Mechanism for the Formation of Isolated Poly(p-xylylene) Fibrous Structures under Shadowing Growth
errLANGMUIR
IF3.9
err2011-03-29
err11
PREAI
errHe, Ming; Wang, Pei-I; Lu, Toh-Ming
err分享
err收藏
Biaxially Textured Al Film Growth on CaF2 Nanostructures toward a Method of Preparing Single-Crystalline Si Film on Glass Substrates
errACS NANO
IF16
err2010-09-14
err11
PREAI
errLi, Huafang; Snow, Patrick; He, Ming; Wang, Pei-I; Wang, Gwo-Ching; Lu, Toh-Ming
err分享
err收藏
Kinetics of Ta ions penetration into porous low-k dielectrics under bias-temperature stress
errAPPLIED PHYSICS LETTERS
IF3.6
err2010-06-01
err16
PREAI
errHe, Ming; Ou, Ya; Wang, Pei-I; Lu, Toh-Ming
err分享
err收藏
Nanostructured copper interfaces for enhanced boiling
errSMALL
IF12.1
err2008-07-31
err474
PREAI
errLi, Chen; Wang, Zuankai; Wang, Pei-I; Peles, Yoav; Koratkar, Nikhil; Peterson, G. P.
err分享
err收藏
Conduction Mechanisms of Ta/Porous SiCOH Films under Electrical Bias
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2008-01-01
err28
PREAI
errOu, Ya; Wang, Pei-I.; He, Ming; Lu, T. -M.; Leung, Pak; Spooner, Terry A.
err分享
err收藏
Thermal stability study of pore sealing using parylene N
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2008-01-01
err9
PREAI
errOu, Ya; Wang, Pei-I; Vanamurthy, Lakshmanan H.; Bakhru, Hassaram; Lu, T. -M.; Spencer, Greg
err分享
err收藏
Instability of metal barrier with porous methyl silsesquioxane films
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2008-01-01
err17
PREAI
errWang, Pei-I; Juneja, Jasbir S.; Ou, Y.; Lu, T. -M.; Spencer, Greg S.
err分享
err收藏
Enhancement of cu(hfac)2 chemisorption on the parylene surface by N2 plasma surface modification
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2007-01-01
err4
PREAI
errPimanpang, S.; Wang, Pei-I; Ye, Dexian; Juneja, Jasbir S.; Wang, G.-C.; Lu, T.-M.
err分享
err收藏
Self-assembled monolayer growth on chemically modified polymer surfaces
errAPPLIED SURFACE SCIENCE
IF6.9
err2006-03-01
err10
PREAI
errPimanpang, S; Wang, PI; Wang, GC; Lu, TM
err分享
err收藏
Stability of Cu on epoxy siloxane polymer under bias temperature stress
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2006-01-01
err1
PREAI
errWang, PI; Juneja, JS; Murarka, SP; Lu, TM; Jezewski, C; Ghoshal, R; Ghoshal, R; Bakhru, H
err分享
err收藏
Bias-temperature stability of Ti-Si-N-O films
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2006-01-01
err6
PREAI
errEe, YC; Juneja, JS; Wang, PI; Lu, TM; Bakhru, H; Chan, L; Law, SB; Yong, C; Chen, Z; Xu, S
err分享
err收藏
A novel polycarbosilane-based low-k dielectric material
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2006-01-01
err31
PREAI
errWang, PI; Wu, ZZ; Lu, TM; Interrante, LV
err分享
err收藏
Inductively coupled hydrogen plasma-assisted Cu ALD on metallic and dielectric surfaces
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2005-01-01
err47
PREAI
errJezewski, C; Lanford, WA; Wiegand, CJ; Singh, JP; Wang, PI; Senkevich, JJ; Lu, TM
err分享
err收藏
Bias-temperature stability of ultrathin parylene-capped dielectrics: influence of surface oxygen on copper ion diffusion
errAPPLIED PHYSICS LETTERS
IF3.6
err2004-04-05
err18
errOAAI
errSenkevich, JJ; Wang, PI; Wiegand, CJ; Lu, TM
err分享
err收藏
Evolution of the Cu-Al alloy/SiO2 interfaces during bias temperature stressing
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2001-01-01
err10
PREAI
errWang, PI; Murarka, SP; Yang, GR; Lu, TM
err分享
err收藏
Surface segregation of Al of the bilayers of pure Cu and Cu-Al alloy films
errJOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
err2001-01-01
err14
PREAI
errWang, PI; Murarka, SP; Kaminski, DA; Bedell, S; Lanford, WA
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
陈钟 封面图
陈钟 (Zhong Chen)
H 指数: 104 · 论文数: 1.2K
Z
Zuankai Wang
H 指数: 96 · 论文数: 516
N
Nikhil Koratkar
H 指数: 92 · 论文数: 342
G
G. P. Peterson
H 指数: 56 · 论文数: 405
Y
Yoav Peles
H 指数: 54 · 论文数: 250
查看更多