Stefan P. Hau‐Riege - Publications, H-index & Citations

Stefan P. Hau‐Riege

united states department of energy (doe)

45H指数

222论文数

1.2W被引数

收录论文 8

发表时间

Ultrafast multi-cycle terahertz measurements of the electrical conductivity in strongly excited solids

NATURE COMMUNICATIONS

IF15.7

2021-03-12

OAAI

Chen, Z.; Curry, C. B.; Zhang, R.; Treffert, F.; Stojanovic, N.; Toleikis, S.; Pan, R.; Gauthier, M.; Zapolnova, E.; Seipp, L. E.; Weinmann, A.; Mo, M. Z.; Kim, J. B.; Witte, B. B. L.; Bajt, S.; Usenko, S.; Soufli, R.; Pardini, T.; Hau-Riege, S.; Burcklen, C.; Schein, J.; Redmer, R.; Tsui, Y. Y.; Ofori-Okai, B. K.; Glenzer, S. H.

Local entanglement and confinement transitions in the random transverse-field Ising model on the pyrochlore lattice

PHYSICAL REVIEW B

IF3.7

2019-10-28

OAAI

Pardini, Tom; Menon, Anirudha; Hau-Riege, Stefan P.; Singh, Rajiv R. P.

Machine-Learning-Based Monitoring of Laser Powder Bed Fusion 基于机器学习的激光粉末床融合监测

ADVANCED MATERIALS TECHNOLOGIES

IF6.2

2018-09-05

137

OAAI

Yuan, Bodi; Guss, Gabriel M.; Wilson, Aaron C.; Hau-Riege, Stefan P.; DePond, Phillip J.; McMains, Sara; Matthews, Manyalibo J.; Giera, Brian

Ultrafast nonthermal heating of water initiated by an X-ray Free-Electron Laser

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

IF9.1

2018-05-14

OAAI

Beyerlein, Kenneth R.; Jonsson, H. Olof; Alonso-Mori, Roberto; Aquila, Andrew; Barty, Sasa; Barty, Anton; Bean, Richard; Koglin, Jason E.; Messerschmidt, Marc; Ragazzon, Davide; Sokaras, Dimosthenis; Williams, Garth J.; Hau-Riege, Stefan; Boutet, Sebastien; Chapman, Henry N.; Imneanu, Nicusor T.; Caleman, Carl

Modeling Evaporation in Aqueous Nanodroplets

BIOPHYSICAL JOURNAL

IF3.1

2014-01-01

OAAI

Bennion, Brian J.; London, Richard A.; Hau-Riege, Stefan P.; Barsky, Daniel

Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources

OPTICS EXPRESS

IF3.3

2010-12-22

OAAI

Sobierajski, R.; Bruijn, S.; Khorsand, A. R.; Louis, E.; de Kruijs, R. W. E. van; Burian, T.; Chalupsky, J.; Cihelka, J.; Gleeson, A.; Grzonka, J.; Gullikson, E. M.; Hajkova, V.; Hau-Riege, S.; Juha, L.; Jurek, M.; Klinger, D.; Krzywinski, J.; London, R.; Pelka, J. B.; Plocinski, T.; Rasinski, M.; Tiedtke, K.; Toleikis, S.; Vysin, L.; Wabnitz, H.; Bijkerk, F.

Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure

OPTICS EXPRESS

IF3.3

2010-01-05

OAAI

Khorsand, A. R.; Sobierajski, R.; Louis, E.; Bruijn, S.; van Hattum, E. D.; van de Kruijs, R. W. E.; Jurek, M.; Klinger, D.; Pelka, J. B.; Juha, L.; Burian, T.; Chalupsky, J.; Cihelka, J.; Hajkova, V.; Vysin, L.; Jastrow, U.; Stojanovic, N.; Toleikis, S.; Wabnitz, H.; Tiedtke, K.; Sokolowski-Tinten, K.; Shymanovich, U.; Krzywinski, J.; Hau-Riege, S.; London, R.; Gleeson, A.; Gullikson, E. M.; Bijkerk, F.

Single particle X-ray diffractive imaging

NANO LETTERS

IF9.1

2007-12-21

236

OAAI

Bogan, Michael J.; Benner, W. Henry; Boutet, Sebastien; Rohner, Urs; Frank, Matthias; Barty, Anton; Seibert, M. Marvin; Maia, Filipe; Marchesini, Stefano; Bajt, Sasa; Woods, Bruce; Riot, Vincent; Hau-Riege, Stefan P.; Svenda, Martin; Marklund, Erik; Spiller, Eberhard; Hajdu, Janos; Chapman, Henry N.

研究方向