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收藏Structural characterization of lamellar multilayer gratings by x-ray reflectivity and scanning electron microscopy
Jergel, M; Mikulík, P; Majková, E; Luby, S; Senderák, R; Pincík, E; Brunel, M; Hudek, P; Kostic, I; Konecníková, A
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收藏Characterization of yttria-stabilized zirconia thin films deposited by electron beam evaporation on silicon substrates
Hartmanova, M; Thurzo, I; Jergel, M; Bartos, J; Kadlec, F; Zelezny, V; Tunega, D; Kundracik, F; Chromik, S; Brunel, M
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收藏Thermal stability of W1-xSix/Si multilayer reflective coatings under high intensity excimer laser pulses
DAnna, E; Luches, A; Martino, M; Brunel, M; Majkova, E; Luby, S; Senderak, R; Jergel, M; Hamelmann, F; Kleineberg, U; Heinzmann, U
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