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D

D. E. East̀man

机构信息待补充

72H指数
206论文数
1.8W被引数
收录论文 4
发表时间
Quantitative metrology study of Cu/SiO2 interconnect structures using fluorescence x-ray microscopy
err2001-02-05
err7
PREAI
errXu, GY; Su, X; Stagarescu, CB; Eastman, DE; Lai, B; Cai, Z; Noyan, IC; Hu, CK
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err收藏
Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy
err2000-11-20
err16
PREAI
errSu, X; Stagarescu, C; Xu, G; Eastman, DE; McNulty, I; Frigo, SP; Wang, YX; Retsch, CC; Noyan, IC; Hu, CK
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Orbital character of O-2p unoccupied states near the Fermi level in CrO2
err2000-04-01
err57
errOAAI
errStagarescu, CB; Su, X; Eastman, DE; Altmann, KN; Himpsel, FJ; Gupta, A
err分享
err收藏