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J

J.‐P. Raskin

universite catholique louvain

19H指数
82论文数
1.2K被引数
收录论文 10
发表时间
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Comparison of TiSi2, CoSi2, and NiSi for thin-film silicon-on-insulator applications
err2019-12-06
err93
PREAI
errChen, J; Colinge, JP; Flandre, D; Gillon, R; Raskin, JP; Vanhoenacker, D
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Tuning the surface conditioning of trapezoidally shaped silicon nanowires by (3-aminopropyl)triethoxysilane
err2014-01-13
err6
errOAAI
errDutu, C. A.; Vlad, A.; Reckinger, N.; Flandre, D.; Raskin, J. -P.; Melinte, S.
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Twisted Bi-Layer Graphene: Microscopic Rainbows扭曲的双层石墨烯: 微观彩虹
errSMALL
IF12.1
err2013-04-22
err37
errOAAI
errCampos-Delgado, J.; Algara-Siller, G.; Santos, C. N.; Kaiser, U.; Raskin, J. -P.
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Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins
err2012-10-01
err58
PREAI
errWang, B.; Idrissi, H.; Galceran, M.; Colla, M. S.; Turner, S.; Hui, S.; Raskin, J. P.; Pardoen, T.; Godet, S.; Schryvers, D.
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Texture-dependent twin formation in nanocrystalline thin Pd films
err2012-06-01
err28
PREAI
errWang, B.; Idrissi, H.; Shi, H.; Colla, M. S.; Michotte, S.; Raskin, J. P.; Pardoen, T.; Schryvers, D.
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High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model
err2012-02-01
err55
PREAI
errColla, M. -S.; Wang, B.; Idrissi, H.; Schryvers, D.; Raskin, J. -P.; Pardoen, T.
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Imperfection-sensitive ductility of aluminium thin films
err2010-05-01
err39
errOAAI
errCoulombier, M.; Boe, A.; Brugger, C.; Raskin, J. P.; Pardoen, T.
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NANOSIL network of excellence-silicon-based nanostructures and nanodevices for long-term nanoelectronics applications
err2008-10-01
err0
PREAI
errBalestra, F.; Parker, E.; Leadley, D.; Mantl, S.; Dubois, E.; Engstrom, O.; Clerc, R.; Cristoloveanu, S.; Kurz, H.; Raskin, J. P.; Lemme, M.; Ionescu, A.; Moselund, K. E.; Boucart, K.; Kasper, E.; Karmous, A.; Baus, M.; Spangenberg, B.; Ostling, M.; Sangiorgi, E.; Ghibaudo, G.; Flandre, D.
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