H. Neff - Publications, H-index & Citations

H. Neff

universidade federal de campina grande

23H指数

148论文数

2.4K被引数

收录论文 11

发表时间

Periodic protein adsorption at the gold/biotin aqueous solution interface: evidence of kinetics with time delay

SCIENTIFIC REPORTS

IF3.9

2016-11-03

OAAI

Neff, H.; Laborde, H. M.; Lima, A. M. N.

The interaction of ozone with bio-fuel, revealed by electrical conduction and infrared spectroscopy

FUEL PROCESSING TECHNOLOGY

IF7.7

2011-11-01

PREAI

Cunha, H. N.; Silva, F. L. A. J.; Melo, J.; Cavalcanti, E. H. S.; Fonseca, T. M.; Melcher, E. U. K.; Lima, A. M. N.; Laborde, H. M.; Neff, H.

A method for determining the mutual diffusion coefficient of molecular solutes based on surface plasmon resonance sensing

SENSORS AND ACTUATORS B-CHEMICAL

IF7.7

2011-06-01

PREAI

Loureiro, F. C. C. L.; Neto, A. G. S. Barreto; Moreira, C. S.; Lima, A. M. N.; Neff, H.

Line Shape Analysis and Extended Instrumental Operation of Surface Plasmon Resonance Sensors

PLASMONICS

IF4.3

2010-04-28

PREAI

Souza Filho, Carlos Alberto; Nogueira Lima, Antonio Marcus; Moreira, Cleumar S.; Thirstrup, Carsten; Neff, Helmut

Temperature-dependent sensitivity of surface plasmon resonance sensors at the gold-water interface

SENSORS AND ACTUATORS B-CHEMICAL

IF7.7

2008-09-01

PREAI

Moreira, C. S.; Lima, A. M. N.; Neff, H.; Thirstrup, C.

Photovoltaic properties and technological aspects of In1-xGaxN/Si, Ge (0

SOLAR ENERGY MATERIALS AND SOLAR CELLS

IF6.3

2006-05-01

PREAI

Neff, H; Semchinova, OK; Lima, AMN; Fillmonov, A; Holzhueter, G

dc-Sheet resistance as sensitive monitoring tool of protein immobilization on thin metal films

BIOSENSORS & BIOELECTRONICS

IF10.5

2006-03-01

OAAI

Neff, H; Beeby, T; Lima, AMN; Borre, M; Thirstrup, C; Zong, W; de Almeida, LAL

Modeling and performance of vanadium-oxide transition edge microbolometers

APPLIED PHYSICS LETTERS

IF3.6

2004-10-18

OAAI

de Almeida, LAL; Deep, GS; Lima, AMN; Khrebtov, IA; Malyarov, VG; Neff, H

A hysteresis model for a vanadium dioxide transition-edge microbolometer

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2001-01-01

OAAI

de Almeida, LAL; Deep, GS; Lima, AMN; Neff, HF; Freire, RCS

Thermal dynamics of VO2 films within the metal-insulator transition:: Evidence for chaos near percolation threshold

APPLIED PHYSICS LETTERS

IF3.6

2000-12-25

PREAI

de Almeida, LAL; Deep, GS; Lima, AMN; Neff, H

Nonlinearity and electrothermal feedback of high Tc transition edge bolometers

APPLIED PHYSICS LETTERS

IF3.6

2000-01-31

PREAI

Neff, H; Lima, AMN; Deep, GS; Freire, RCS; Melcher, E; Khrebtov, IA; Tkachenko, AD

研究方向