F. Schäfers - Publications, H-index & Citations

F. Schäfers

Helmholtz Association

40H指数

218论文数

5.7K被引数

收录论文 19

发表时间

Highly reflective Ru/Y multilayer mirrors for the spectral range of 9-11 nm

OPTICS EXPRESS

IF3.3

2022-05-18

OAAI

Polkovnikov, V. N.; Shaposhnikov, R. A.; Zuev, S. Yu; Svechnikov, M., V; Sertsu, M. G.; Sokolov, A.; Schafers, F.; Chkhalo, N., I

Single-walled carbon nanotube membranes for optical applications in the extreme ultraviolet rang (vol 155, pg 734, 2019)

CARBON

IF11.6

2020-01-01

PREAI

Gubarev, V. M.; Yakovlev, V. Y.; Sertsu, M. G.; Yakushev, O. F.; Krivtsun, V. M.; Gladush, Yu G.; Ostanin, I. A.; Sokolov, A.; Schaefers, F.; Medvedev, V. V.; Nasibulin, A. G.

Influence of barrier interlayers on the performance of Mo/Be multilayer mirrors for next-generation EUV lithography

OPTICS EXPRESS

IF3.3

2018-12-12

OAAI

Svechnikov, M. V.; Chkhalo, N. I.; Gusev, S. A.; Nechay, A. N.; Pariev, D. E.; Pestov, A. E.; Polkovnikov, V. N.; Tatarskiy, D. A.; Salashchenko, N. N.; Schaefers, F.; Sertsu, M. G.; Sokolov, A.; Vainer, Y. A.; Zorina, M. V.

Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

SCIENTIFIC REPORTS

IF3.9

2018-10-24

OAAI

Majhi, A.; Nayak, Maheswar; Pradhar, P. C.; Filatova, E. O.; Sokolov, A.; Schaefers, F.

Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution (vol 5, 8618, 2015)

SCIENTIFIC REPORTS

IF3.9

2016-07-11

OAAI

Nayak, Maheswar; Pradhan, P. C.; Lodha, G. S.; Sokolov, A.; Schafers, F.

Highly efficient blazed grating with multilayer coating for tender X-ray energies

OPTICS EXPRESS

IF3.3

2016-06-07

OAAI

Senf, F.; Bijkerk, F.; Eggenstein, F.; Gwalt, G.; Huang, Q.; Kruijs, R.; Kutz, O.; Lemke, S.; Louis, E.; Mertin, M.; Packe, I.; Rudolph, I.; Schaefers, F.; Siewert, F.; Sokolov, A.; Sturm, J. M.; Waberski, Ch.; Wang, Z.; Wolf, J.; Zeschke, T.; Erko, A.

Hard x-ray photoemission spectroscopy on the trilayer system MgO/Au/Fe using standing-wave excitation

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2013-08-28

PREAI

Doering, S.; Schoenbohm, F.; Berges, U.; Buergler, D. E.; Schneider, C. M.; Gorgoi, M.; Schaefers, F.; Westphal, C.

High performance La/B4C multilayer mirrors with barrier layers for the next generation lithography

APPLIED PHYSICS LETTERS

IF3.6

2013-01-07

PREAI

Chkhalo, N. I.; Kuenstner, S.; Polkovnikov, V. N.; Salashchenko, N. N.; Schaefers, F.; Starikov, S. D.

Local structure and site substitution in amorphous and quasicrystalline Zr-Ti-Ni-(Cu) alloys

APPLIED PHYSICS LETTERS

IF3.6

2010-07-30

PREAI

Mechler, S.; Schumacher, G.; Koteski, V.; Riesemeier, H.; Schaefers, F.; Mahnke, H. -E.

Influence of sputter damage on the XPS analysis of metastable nanocomposite coatings 溅射损伤对亚稳态纳米复合涂层XPS分析的影响

SURFACE & COATINGS TECHNOLOGY

IF6.1

2009-11-01

PREAI

Lewin, Erik; Gorgoi, Mihaela; Schafers, Franz; Svensson, Svante; Jansson, Ulf

High-kinetic-energy photoemission spectroscopy of Ni at 1s: 6-eV satellite at 4 eV

PHYSICAL REVIEW B

IF3.7

2008-12-30

PREAI

Karis, O.; Svensson, S.; Rusz, J.; Oppeneer, P. M.; Gorgoi, M.; Schaefers, F.; Braun, W.; Eberhardt, W.; Martensson, N.

On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films

SURFACE & COATINGS TECHNOLOGY

IF6.1

2008-04-01

176

PREAI

Lewin, E.; Persson, P. O. A.; Lattemann, M.; Stueber, M.; Gorgoi, M.; Sandell, A.; Ziebert, C.; Schaedfers, F.; Braun, W.; Halbritter, J.; Ulrich, S.; Eberhardt, W.; Hultman, L.; Siegbahn, H.; Svensson, S.; Jansson, U.

X-ray absorption spectroscopy study at the SiK-edge of tungsten carbide-silicon carbide thin films 碳化钨-碳化硅薄膜SiK边缘的x射线吸收光谱研究

SCRIPTA MATERIALIA

IF5.6

2007-06-01

PREAI

Krzanowski, J. E.; Palacin, S.; Gutierrez, A.; Schaefers, F.; Mertin, M.; Endrino, J. L.; Soriano, L.

Determination of the local environment of silicon and the microstructure of quaternary CrAl(Si)N films

ACTA MATERIALIA

IF9.3

2007-04-01

PREAI

Endrino, J. L.; Palacin, S.; Aguirre, M. H.; Gutierrez, A.; Schaefers, F.