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B

B. Drévillon

Universite Paris Saclay

42H指数
357论文数
6.8K被引数
收录论文 22
发表时间
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Antonello De Martino (1954-2014): in memoriam
errJOURNAL OF BIOMEDICAL OPTICS
IF2.9
err2016-06-22
err4
errOAAI
errNovikova, Tatiana; Drevillon, Bernard; Schwartz, Laurent; Validire, Pierre; Nazac, Andre; Ossikovski, Razvigor; Garcia-Caurel, Enric; Laude-Boulesteix, Blandine; Anastasiadou, Makrina; Losurdo, Maria; Hinderl, Kurt; Ibrahim, Bicher Haj; Antonelli, Maria-Rosaria; Pierangelo, Angelo; Deby, Stanislas; Roussel, Stephane; Manhas, Sandeep; Vizet, Jeremy; Pagnoux, Dominique; Bancelin, Stephane; Schanne-Klein, Marie-Claire; Rehbinder, Jean; Haddad, Huda; Moreau, Francois; Vanel, Jean-Charles; Roca i Cabarrocas, Pere; Tuchin, Valery; Jacques, Steven
err分享
err收藏
Effective medium approximation of anisotropic lamellar nanogratings based on Fourier factorization
errOPTICS EXPRESS
IF3.3
err2006-01-01
err16
errOAAI
errFoldyna, M; Ossikovski, R; De Martino, A; Drevillon, B; Postava, K; Ciprian, D; Pistora, J; Watanabe, K
err分享
err收藏
FTIR phase-modulated ellipsometry measurements of micro crystalline silicon films deposited by hot-wire CVD
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err2002-04-01
err3
PREAI
errGarcia-Caurel, E; Niikura, C; Kim, SY; Drévillon, B; Bourée, JE
err分享
err收藏
Measurement of transversal ambipolar diffusion coefficient in microcrystalline silicon
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err2000-05-01
err10
PREAI
errBrenot, R; Vanderhaghen, R; Drévillon, B; Cabarrocas, PRI
err分享
err收藏
Process monitoring of semiconductor thin films and interfaces by spectroellipsometry
errAPPLIED SURFACE SCIENCE
IF6.9
err2000-02-01
err5
PREAI
errBrenot, R; Drévillon, B; Bulkin, P; Roca i Cabarrocas, P; Vanderhaghen, R
err分享
err收藏
Radiative and nonradiative recombination in polymerlike α-C:H films
errPHYSICAL REVIEW B
IF3.7
err1999-08-15
err87
PREAI
errHeitz, T; Godet, C; Bourée, JE; Drévillon, B; Conde, JP
err分享
err收藏
C-H bonding of polymer-like hydrogenated amorphous carbon films investigated by in-situ infrared ellipsometry
errCARBON
IF11.6
err1999-04-01
err14
PREAI
errHeitz, T; Drévillon, B; Godet, C; Bourée, JE
err分享
err收藏
Plasma enhanced chemical vapour deposition of SiOxNy in an integrated distributed electron cyclotron resonance reactor
errAPPLIED SURFACE SCIENCE
IF6.9
err1999-04-01
err16
PREAI
errHofrichter, A; Bulkin, P; Drévillon, B
err分享
err收藏
Quantitative study of C-H bonding in polymerlike amorphous carbon films using in situ infrared ellipsometry使用原位红外椭偏仪定量研究聚合物状非晶碳膜中的c-h键
errPHYSICAL REVIEW B
IF3.7
err1998-11-15
err134
PREAI
errHeitz, T; Drevillon, B; Godet, C; Bouree, JE
err分享
err收藏
Structure and transport properties of integrated distributed electron cyclotron resonance grown micro-crystalline silicon
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1998-08-01
err3
PREAI
errBulkin, P; Brenot, R; Drevillon, B; Vanderhaghen, R
err分享
err收藏
Photoluminescence of polymer-like amorphous carbon films grown in different plasma reactors
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1998-05-01
err13
PREAI
errBouree, JE; Heitz, T; Godet, C; Drevillon, B; Conde, JP; Chu, V; Berberan-Santos, MN; Fedorov, A
err分享
err收藏
X-ray photoelectron spectra of adhesion-enhanced a-Si:H on stainless steel induced by plasma treatments
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1998-05-01
err3
PREAI
errGheorghiu-de La Rocque, A; Bertrand, N; Bonnefont, PA; Bulkin, P; Drevillon, B; Senemaud, C
err分享
err收藏
In situ characterization of microcrystalline silicon by time resolved microwave conductivity
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1998-05-01
err9
PREAI
errBrenot, R; Bulkin, P; Cabarrocas, PRI; Drevillon, B; Vanderhaghen, R
err分享
err收藏
Early stages of the growth of hydrogenated amorphous carbon investigated by in situ infrared ellipsometry
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1998-05-01
err4
PREAI
errHeitz, T; Drevillon, B; Bouree, JE; Godet, C
err分享
err收藏
Real-time control of the deposition of optical coatings by multiwavelength ellipsometry通过多波长椭偏仪实时控制光学涂层的沉积
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err1998-03-01
err4
PREAI
errKildemo, M; Drevillon, B
err分享
err收藏
In situ infrared ellipsometry study of hydrogenated amorphous carbon/Si interface formation
errAPPLIED PHYSICS LETTERS
IF3.6
err1998-02-16
err9
PREAI
errHeitz, T; Drevillon, B; Bouree, JE; Godet, C
err分享
err收藏
In situ spectroellipsometry study of the crosslinking of polypropylene by an argon plasma
errAPPLIED SURFACE SCIENCE
IF6.9
err1997-01-01
err56
PREAI
errVallon, S; Drevillon, B; PoncinEpaillard, F
err分享
err收藏
Infrared-ellipsometry evidence of disorder-induced vibrational frequency shifts in hydrogenated-amorphous-silicon thin films
errPHYSICAL REVIEW B
IF3.7
err1996-10-15
err21
PREAI
errOssikovski, R; Drevillon, B
err分享
err收藏
Real time control of plasma deposited multilayers by multiwavelength ellipsometry
errAPPLIED PHYSICS LETTERS
IF3.6
err1996-06-10
err18
PREAI
errKildemo, M; Bulkin, P; Deniau, S; Drevillon, B
err分享
err收藏
Optical and luminescence properties of polymer-like a-C:H films deposited in a dual-mode PECVD reactor
errJOURNAL OF NON-CRYSTALLINE SOLIDS
IF3.5
err1996-05-01
err15
PREAI
errBouree, JE; Godet, C; Drevillon, B; Etemadi, R; Heitz, T; Cernogora, J; Fave, JL
err分享
err收藏

研究方向

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合作学者
合作期刊
V
Valery V. Tuchin
H 指数: 71 · 论文数: 1.7K
S
Steven L. Jacques
H 指数: 71 · 论文数: 606
P
Pierre Validire
H 指数: 63 · 论文数: 599
А
А.А. Федоров
H 指数: 53 · 论文数: 824
P
Pere Roca i Cabarrocas
H 指数: 52 · 论文数: 696
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