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D

Dae Yeon Kim

pusan national university

H指数:10

被引数:604

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Energy harvesting performance of an EDLC power generator based on pure water and glycerol mixture: analytical modeling and experimental validation

SCIENTIFIC REPORTS

IF3.9

2021-12-063

OAAI

Effect of Metal Foam Insert Configurations on Flow Boiling Heat Transfer and Pressure Drop in a Rectangular Channel

金属泡沫插入结构对矩形通道中流动沸腾传热和压降的影响

IF3.2

2021-08-175

OAAI

Flow-pattern-based experimental analysis of convective boiling heat transfer in a rectangular channel filled with open-cell metallic random porous media

INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER

IF5.8

2019-10-0119

PREAI

An experimental study on the thermal and hydraulic characteristics of open-cell nickel and copper foams for compact heat exchangers

INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER

IF5.8

2019-03-0123

PREAI

Microstructure and mechanical properties of Ni foam/stainless steel joint brazed using Ni-based alloy

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

IF7

2019-01-0112

PREAI

Experimental study of the effect of brazed compact metal-foam evaporator in an organic Rankine cycle performance: Toward a compact ORC

ENERGY CONVERSION AND MANAGEMENT

IF10.9

2018-10-0130

PREAI

Application of metal foam heat exchangers for a high-performance quefied natural gas regasification system

IF9.4

2016-06-0141

PREAI

Thermal performance of a 10-kW phase-change plate heat exchanger with metal foam filled channels

APPLIED THERMAL ENGINEERING

IF6.9

2016-04-0138

PREAI

Design and Demonstration of 820-GHz Array Using Diode-Connected NMOS Transistors in 130-nm CMOS for Active Imaging

IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY

IF4

2016-03-0170

PREAI

Density functional theory investigation of the electronic structure and thermoelectric properties of layered MoS2, MoSe2 and their mixed-layer compound

层状MoS2，MoSe2及其混合层化合物的电子结构和热电性能的密度泛函理论研究

JOURNAL OF SOLID STATE CHEMISTRY

IF3.5

2014-03-0142

PREAI

Physical origin of threshold voltage problems in polycrystalline silicon/HfO2 gate stacks

APPLIED PHYSICS LETTERS

IF3.6

2006-04-183

PREAI