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Claudius Klein

karlsruhe institute of technology

12H指数
37论文数
501被引数
收录论文 5
发表时间
Diffraction stress factors calculated using a maximum entropy method采用最大熵方法计算的衍射应力因子
err2026-07-21
err0
errOAAI
errMaximilian Krause; Nicola Simon; Claudius Klein; Jens Gibmeier; Thomas Böhlke
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Barrier-free subsurface incorporation of 3d metal atoms into Bi(111) films
err2015-05-27
err9
errOAAI
errKlein, C.; Vollmers, N. J.; Gerstmann, U.; Zahl, P.; Luekermann, D.; Jnawali, G.; Pfnuer, H.; Tegenkamp, C.; Sutter, P.; Schmidt, W. G.; Horn-von Hoegen, M.
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Epitaxial growth of the topological insulator Bi2Se3 on Si(111): Growth mode, lattice parameter, and strain state
err2013-09-12
err20
PREAI
errVyshnepolsky, M.; Klein, C.; Klasing, F.; Hanisch-Blicharski, A.; Horn-von Hoegen, M.
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Scattering at magnetic and nonmagnetic impurities on surfaces with strong spin-orbit coupling
err2012-11-28
err17
PREAI
errLuekermann, D.; Sologub, S.; Pfnuer, H.; Klein, C.; Horn-von Hoegen, M.; Tegenkamp, C.
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Interplay of Wrinkles, Strain, and Lattice Parameter in Graphene on Iridium铱上石墨烯中皱纹,应变和晶格参数的相互作用
err2012-01-09
err138
errOAAI
errHattab, Hichem; N'Diaye, Alpha T.; Wall, Dirk; Klein, Claudius; Jnawali, Giriraj; Coraux, Johann; Busse, Carsten; van Gastel, Raoul; Poelsema, Bene; Michely, Thomas; Heringdorf, Frank-J. Meyer Zu; Horn-von Hoegen, Michael
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