未登录Coupled Degradation Behavior in a Monolithically Integrated GaN Power Chip Under Load Dump Stress单块集成GaN功率芯片在负载瞬变应力下的耦合降解行为
Zeng, Huangtao; Yang, Chao; He, Zhiyuan; Shi, Yijun; He, Liang; Lu, Guoguang; Chen, Yuan; Chen, Xinghuan; Zhou, Xianzhong; Shen, Zhipeng
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收藏Efficient Indium-Doped TiOx Electron Transport Layers for High-Performance Perovskite Solar Cells and Perovskite-Silicon Tandems
Peng, Jun; Duong, The; Zhou, Xianzhong; Shen, Heping; Wu, Yiliang; Mulmudi, Hemant Kumar; Wan, Yimao; Zhong, Dingyong; Li, Juntao; Tsuzuki, Takuya; Weber, Klaus J.; Catchpole, Kylie R.; White, Thomas P.
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