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T

Thomas M. M. Heenan

University College London
H指数:42
被引数:5,253

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The battery failure databank: Insights from an open-access database of thermal runaway behaviors of Li-ion cells and a resource for benchmarking risks

电池故障数据库: 来自锂离子电池热失控行为的开放访问数据库和基准风险资源的见解

JOURNAL OF POWER SOURCES
IF7.9
2024-03-0114
OAAI
Finegan, Donal P.; Billman, Julia; Darst, Jacob; Hughes, Peter; Trillo, Jesus; Sharp, Matt; Benson, Alex; Pham, Martin; Kesuma, Inez; Buckwell, Mark; Reid, Hamish T.; Kirchner-Burles, Charlie; Fransson, Matilda; Petrushenko, David; Heenan, Thomas M. M.; Jervis, Rhodri; Owen, Rhodri; Patel, Drasti; Broche, Ludovic; Rack, Alexander; Magdysyuk, Oxana; Keyser, Matt; Walker, William; Shearing, Paul; Darcy, Eric
Multi-Dimensional Characterization of Battery Materials

电池材料的多维表征

ADVANCED ENERGY MATERIALS
IF26
2023-05-0116
OAAI
Ziesche, Ralf F. F.; Heenan, Thomas M. M.; Kumari, Pooja; Williams, Jarrod; Li, Weiqun; Curd, Matthew E. E.; Burnett, Timothy L. L.; Robinson, Ian; Brett, Dan J. L.; Ehrhardt, Matthias J. J.; Quinn, Paul D. D.; Mehdi, Layla B. B.; Withers, Philip J. J.; Britton, Melanie M. M.; Browning, Nigel D. D.; Shearing, Paul R. R.
The effect of cell geometry and trigger method on the risks associated with thermal runaway of lithium-ion batteries

电池几何形状和触发方法对锂离子电池热失控相关风险的影响

JOURNAL OF POWER SOURCES
IF7.9
2022-03-0127
OAAI
Walker, William Q.; Cooper, Kylie; Hughes, Peter; Doemling, Ian; Akhnoukh, Mina; Taylor, Sydney; Darst, Jacob; Billman, Julia; Sharp, Matthew; Petrushenko, David; Owen, Rhodri; Pham, Martin; Heenan, Thomas; Rack, Alexander; Magdsyuk, Oxana; Connolley, Thomas; Brett, Dan; Shearing, Paul; Finegan, Donal; Darcy, Eric
Thermal Runaway of Li-Ion Cells: How Internal Dynamics, Mass Ejection, and Heat Vary with Cell Geometry and Abuse Type

锂离子电池的热失控: 内部动力学，质量喷射和热量如何随电池几何形状和滥用类型而变化

JOURNAL OF THE ELECTROCHEMICAL SOCIETY
IF3.3
2022-02-0919
OA
Sharp, Matthew; Darst, John Jacob; Hughes, Peter; Billman, Julia; Pham, Martin; Petrushenko, David; Heenan, Thomas M. M.; Jervis, Rhodri; Owen, Rhodri; Patel, Drasti; Wenjia, Du; Michael, Harry; Rack, Alexander; Magdysyuk, Oxana, V; Connolley, Thomas; Brett, Dan J. L.; Hinds, Gareth; Keyser, Matt; Darcy, Eric; Shearing, Paul R.; Walker, William; Finegan, Donal P.

研究方向

暂未获取到该数据
P
Paul R. Shearing
H 指数:88论文数:752被引数:2.9万
D
Dan J. L. Brett
H 指数:97论文数:1,105被引数:3.7万
R
Rhodri Jervis
H 指数:42论文数:219被引数:6,211
C
Chun Tan
H 指数:29论文数:117被引数:3,120
D
Donal P. Finegan
H 指数:52论文数:421被引数:8,040
X
Xuekun Lu
H 指数:33论文数:82被引数:4,024
J
James B. Robinson
H 指数:43论文数:255被引数:7,136
S
Sohrab R. Daemi
H 指数:17论文数:30被引数:1,748
D
Dan J. L. Brett
H 指数:0论文数:10被引数:2
A
Aaron Wade
H 指数:10论文数:29被引数:647