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Suneet Tuli

indian institute of technology system (iit system)

17H指数
77论文数
1.2K被引数
收录论文 17
发表时间
Degradation of organic light emitting diode: Heat related issues and solutions
err2016-06-01
err50
PREAI
errTyagi, Priyanka; Srivastava, Ritu; Giri, Lalat Indu; Tuli, Suneet; Lee, Changhee
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Fault detection of antenna arrays using infrared thermography
err2015-07-01
err7
PREAI
errMuzaffar, Khalid; Giri, Lalat Indu; Chatterjee, Krishnendu; Tuli, Suneet; Koul, Shiban
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Conductive cooling in white organic light emitting diode for enhanced efficiency and life time
err2015-01-06
err5
errOAAI
errTyagi, Priyanka; Kumar, Arunandan; Giri, Lalat Indu; Tuli, Suneet; Srivastava, Ritu
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Exciton quenching by diffusion of 2,3,5,6-tetrafluoro7,7′,8,8′-tetra cyano quino dimethane and its consequences on joule heating and lifetime of organic light-emitting diodes
err2013-09-24
err16
PREAI
errTyagi, Priyanka; Kumar, Arunandan; Giri, Lalat Indu; Dalai, Manas Kumar; Tuli, Suneet; Kamalasanan, M. N.; Srivastava, Ritu
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Study of shifting of recombination zone in multi-emissive layer organic light emitting devices and its effect on color stability
err2013-04-01
err19
PREAI
errTyagi, Priyanka; Srivastava, Ritu; Kumar, Arunandan; Tuli, Suneet; Kamalasanan, M. N.
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A comparison of the pulsed, lock-in and frequency modulated thermography nondestructive evaluation techniques
err2011-11-01
err160
errOAAI
errChatterjee, Krishnendu; Tuli, Suneet; Pickering, Simon G.; Almond, Darryl P.
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Mirage-effect-based depth profiling of micromachined silicon structures
err1998-01-01
err5
PREAI
errTuli, S; Bhattacharyya, AB; Forget, BC; Fournier, D
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Electronic diffusivity measurement in silicon by photothermal microscopy
err1996-08-19
err35
PREAI
errForget, BC; Barbereau, I; Fournier, D; Tuli, S; Battacharyya, AB
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