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A. Leyland

University of Sheffield

50H指数
195论文数
1.7W被引数
收录论文 8
发表时间
A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing
errSENSORS
IF3.5
err2023-06-04
err3
errOAAI
errSanchez-Arriaga, Nestor Eduardo; Tiwari, Divya; Hutabarat, Windo; Leyland, Adrian; Tiwari, Ashutosh
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On the interstitial induced lattice inhomogeneities in nitrogen-expanded austenite
err2020-08-01
err17
errOAAI
errTao, Xiao; Qi, Jiahui; Rainforth, Mark; Matthews, Allan; Leyland, Adrian
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Crystal size induced reduction in thermal hysteresis of Ni-Ti-Nb shape memory thin films
err2016-04-29
err20
errOAAI
errLi, K.; Li, Y.; Yu, K. Y.; Liu, C.; Gibson, D.; Leyland, A.; Matthews, A.; Fu, Y. Q.
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Deposition and characterisation of carbon-containing tungsten coatings prepared by reactive magnetron sputtering
errVACUUM
IF3.9
err1998-04-01
err22
PREAI
errRebholz, C; Schneider, JM; Ziegele, H; Rahle, B; Leyland, A; Matthews, A
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Widening the market for advanced PVD coatings
err1996-01-01
err11
PREAI
errMatthews, A; Leyland, A; Stevenson, P
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err收藏