arrow
返回
S

S. Uthanna

vit vellore

36H指数
226论文数
3.3K被引数
收录论文 26
发表时间
Role of interfacial oxide layer thickness and annealing temperature on structural and electronic properties of Al/Ta2O5/TiO2/Si metal-insulator-semiconductor structure
err2017-09-01
err16
PREAI
errSekhar, M. Chandra; Reddy, Nallabala Nanda Kumar; Akkera, Harish Sharma; Reddy, B. Purusottam; Rajendar, V.; Uthanna, S.; Park, Si-Hyun
err分享
err收藏
Structural, optical and electrical properties of DC reactive magnetron sputtered (Ta2O5)1-x(TiO2)x thin films
err2016-12-01
err18
PREAI
errSekhar, M. Chandra; Reddy, N. Nanda Kumar; Verma, V. K.; Uthanna, S.
err分享
err收藏
Effect of annealing on the structural, microstructural and optical properties of co-evaporated Cu2SnS3 thin films
errVACUUM
IF3.9
err2015-07-01
err51
PREAI
errChalapathi, U.; Jayasree, Y.; Uthanna, S.; Raja, V. Sundara
err分享
err收藏
Post-deposition annealing influenced structural and electrical properties of Al/TiO2/Si gate capacitors
err2013-10-01
err17
PREAI
errSekhar, M. Chandra; Kondaiah, P.; Rao, G. Mohan; Chandra, S. V. Jagadeesh; Uthanna, S.
err分享
err收藏
Effect of substrate bias voltage on the structure, electric and dielectric properties of TiO2 thin films by DC magnetron sputtering
err2011-12-01
err45
PREAI
errSekhar, M. Chandra; Kondaiah, P.; Chandra, S. V. Jagadeesh; Rao, G. Mohan; Uthanna, S.
err分享
err收藏
Electrical and optical properties of In2O3:Mo thin films prepared at various Mo-doping levels
err2010-08-01
err39
PREAI
errKaleemulla, S.; Rao, N. Madhusudhana; Joshi, M. Girish; Reddy, A. Sivasankar; Uthanna, S.; Reddy, P. Sreedhara
err分享
err收藏
Physical properties of In2O3 thin films prepared at various oxygen partial pressures
err2009-06-01
err70
errOAAI
errKaleemulla, S.; Reddy, A. Sivasankar; Uthanna, S.; Reddy, P. Sreedhara
err分享
err收藏
Effect of substrate temperature on the physical properties of dc magnetron sputtered CuAlO2 films
err2009-04-01
err32
PREAI
errReddy, A. Sivasankar; Park, Hyung-Ho; Rao, G. Mohan; Uthanna, S.; Reddy, P. Sreedhara
err分享
err收藏
Effect of substrate temperature on the physical properties of In2O3:Mo films: Prepared by an activated reactive evaporation
errVACUUM
IF3.9
err2009-02-01
err14
PREAI
errKaleemulla, S.; Reddy, A. Sivasankar; Uthanna, S.; Reddy, R. Sreedhara
err分享
err收藏
Optical absorption studies on polycrystalline Cu0.5Ag0.5InSe2 thin films
errVACUUM
IF3.9
err2002-09-01
err9
PREAI
errRao, GV; Chandra, GH; Reddy, PS; Hussain, OM; Reddy, KTR; Uthanna, S
err分享
err收藏
err分享
err收藏
Characterization of Cu0.5Ag0.5InSe2 thin films
err2001-07-01
err12
PREAI
errRao, GV; Chandra, GH; Hussain, OM; Uthanna, S; Naidu, BS
err分享
err收藏
Studies on dc magnetron sputtered cadmium oxide films
err2001-01-01
err61
PREAI
errSubramanyam, TK; Naidu, BS; Uthanna, S
err分享
err收藏