Sarah H. Olsen - Publications, H-index & Citations

Sarah H. Olsen

newcastle university - uk

23H指数

136论文数

1.6K被引数

收录论文 7

发表时间

Effects of DC Magnetron Sputtering Parameters on the Topography and Magnetic Properties of Galfenol/SiC Films 直流磁控溅射参数对Galfenol/SiC薄膜形貌和磁性能的影响

IEEE Transactions on Magnetics

IF1.9

2026-02-01

PREAI

Tang, Yu; Gallacher, Barry; Yu, Zimeng; Olsen, Sarah

Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures

APPLIED PHYSICS LETTERS

IF3.6

2011-12-14

OAAI

Escobedo-Cousin, E.; Olsen, S. H.; Pardoen, T.; Bhaskar, U.; Raskin, J. -P.

Defect identification in strained Si/SiGe heterolayers for device applications

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2009-08-17

PREAI

Escobedo-Cousin, E.; Olsen, S. H.; O'Neill, A. G.; Coulson, H.

Nanoscale strain characterisation for ultimate CMOS and beyond

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2008-10-01

PREAI

Olsen, Sarah H.; Dobrosz, Peter; Agaiby, Rouzet M. B.; Tsang, Yuk Lun; Alatise, Olayiwola; Bull, Stephen J.; O'Neill, Anthony G.; Moselund, Kirsten E.; Ionescu, Adrian M.; Majhi, Prashant; Buca, Dan; Mantl, Siegfried; Coulson, Howard

Reduced self-heating by strained silicon substrate engineering

APPLIED SURFACE SCIENCE

IF6.9

2008-07-01

PREAI

O'Neill, A.; Agaiby, R.; Olsen, S.; Yang, Y.; Hellstrom, P. -E.; Ostling, M.; Oehme, M.; Lyutovich, K.; Kasper, E.; Eneman, G.; Verheyen, P.; Loo, R.; Claeys, C.; Fiegna, C.; Sangiorgi, E.

The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures

SURFACE & COATINGS TECHNOLOGY

IF6.1

2005-11-01

PREAI

Dobrosz, P; Bull, SJ; Olsen, SH; O'Neill, AG

Strained-Si n-MOS surface-channel and buried Si0.7Ge0.3 compressively- strained p-MOS fabricated in a 0.25 μm heterostructure CMOS process

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2005-02-01

PREAI

Paul, DJ; Temple, M; Olsen, SH; ONeill, AG; Tang, YT; Waite, AM; Cerrina, C; Evans, AGR; Li, X; Zhang, J; Norris, DJ; Cullis, AG

研究方向