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收藏Electromigration-induced plastic deformation in passivated metal lines
Valek, BC; Bravman, JC; Tamura, N; MacDowell, AA; Celestre, RS; Padmore, HA; Spolenak, R; Brown, WL; Batterman, BW; Patel, JR
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收藏High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction
Tamura, N; MacDowell, AA; Celestre, RS; Padmore, HA; Valek, B; Bravman, JC; Spolenak, R; Brown, WL; Marieb, T; Fujimoto, H; Batterman, BW; Patel, JR
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