G. Koster - Publications, H-index & Citations

G. Koster

university of twente

6H指数

19论文数

478被引数

收录论文 5

发表时间

Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction

PHYSICAL REVIEW MATERIALS

IF3.4

2020-08-20

OAAI

Smink, A. E. M.; Birkholzer, Y. A.; Dam, J. van; Roesthuis, F. J. G.; Rijnders, G.; Hilgenkamp, H.; Koster, G.

Towards Oxide Electronics: a Roadmap 走向氧化物电子学: 路线图

APPLIED SURFACE SCIENCE

IF6.9

2019-07-01

259

OAAI

Coll, M.; Fontcuberta, J.; Althammer, M.; Bibes, M.; Boschker, H.; Calleja, A.; Cheng, G.; Cuoco, M.; Dittmann, R.; Dkhil, B.; El Baggari, I; Fanciulli, M.; Fina, I; Fortunato, E.; Frontera, C.; Fujita, S.; Garcia, V; Goennenwein, S. T. B.; Granqvist, C-G; Grollier, J.; Gross, R.; Hagfeldt, A.; Herranz, G.; Hono, K.; Houwman, E.; Huijben, M.; Kalaboukhov, A.; Keeble, D. J.; Koster, G.; Kourkoutis, L. F.; Levy, J.; Lira-Cantu, M.; MacManus-Driscoll, J. L.; Mannhart, Jochen; Martins, R.; Menzel, S.; Mikolajick, T.; Napari, M.; Nguyen, M. D.; Niklasson, G.; Paillard, C.; Panigrahi, S.; Rijnders, G.; Sanchez, F.; Sanchis, P.; Sanna, S.; Schlom, D. G.; Schroeder, U.; Shen, K. M.; Siemon, A.; Spreitzer, M.; Sukegawa, H.; Tamayo, R.; van den Brink, J.; Pryds, N.; Granozio, F. Miletto

Prediction of thickness limits of ideal polar ultrathin films

PHYSICAL REVIEW B

IF3.7

2012-03-26

OAAI

Zhong, Zhicheng; Koster, G.; Kelly, Paul J.

Direct patterning of functional interfaces in oxide heterostructures

APPLIED PHYSICS LETTERS

IF3.6

2012-01-23

OAAI

Banerjee, N.; Huijben, M.; Koster, G.; Rijnders, G.