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J

J.P. Rivière

universite de poitiers

26H指数
135论文数
2.5K被引数
收录论文 26
发表时间
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Preface
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2014-10-01
err0
PREAI
errPichon, Luc; Abadias, Gregory; Templier, Claude; Riviere, Jean-Paul
err分享
err收藏
Ion beam assisted deposition of TiN-Ni nanocomposite coatings
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2011-11-01
err38
PREAI
errAkbari, A.; Templier, C.; Beaufort, M. F.; Eyidi, D.; Riviere, J. P.
err分享
err收藏
Structural evolution of Ti-Al-Si-N nanocomposite coatings
errVACUUM
IF3.9
err2009-06-01
err42
errOAAI
errCarvalho, S.; Rebouta, L.; Ribeiro, E.; Vaz, F.; Tavares, C. J.; Alves, E.; Barradas, N. P.; Riviere, J. P.
err分享
err收藏
Effect of the microstructure on the cutting performance of superhard (Ti,Si,Al)N nanocomposite films
errVACUUM
IF3.9
err2008-08-01
err13
errOAAI
errFernandes, C.; Carvalho, S.; Rebouta, L.; Vaz, F.; Denannot, M. F.; Pacaud, J.; Riviere, J. P.; Cavaleiro, A.
err分享
err收藏
Effect of thermal treatments on the structure of MoNxOy thin films
errVACUUM
IF3.9
err2008-08-01
err18
errOAAI
errCunha, L.; Rebouta, L.; Vaz, F.; Staszuk, M.; Malara, S.; Barbosa, J.; Carvalho, P.; Alves, E.; Le Bourhis, E.; Goudeau, Ph.; Riviere, J. P.
err分享
err收藏
3D statistical analysis of a copper powder sintering observed in situ by synchrotron microtomography
errACTA MATERIALIA
IF9.3
err2008-03-01
err55
errOAAI
errVagnon, A.; Riviere, J. P.; Missiaen, J. M.; Bellet, D.; Di Michiel, M.; Josserond, C.; Bouvard, D.
err分享
err收藏
The effect of bombarding conditions on the properties of multifunctional Ti-C-O thin films grown by magnetron sputtering
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2007-12-01
err19
PREAI
errFernandes, A. C.; Cunha, L.; Moura, C.; Vaz, F.; Carvalho, P.; Le Bourhis, E.; Goudeau, Ph.; Riviere, J. P.; Parreira, N. M. G.
err分享
err收藏
Silicon based coatings deposited by dynamic ion mixing for oxidation protection of a Ti6242 alloy
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2007-08-01
err16
PREAI
errRiviere, J. P.; Pichon, L.; Drouet, M.; Poquillon, D.; Galdikas, A.
err分享
err收藏
Influence of the O/C ratio in the behaviour of TiCxOy thin films
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2007-02-01
err31
errOAAI
errFernandes, A. C.; Vaz, F.; Rebouta, L.; Pinto, A.; Alves, E.; Parreira, N. M. G.; Goudeau, Ph.; Le Bourhis, E.; Riviere, J. P.
err分享
err收藏
Structural evolution in ZrNxOy thin films as a function of temperature
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2006-02-01
err49
errOAAI
errCunha, L; Vaz, F; Moura, C; Rebouta, L; Carvalho, P; Alves, E; Cavaleiro, A; Goudeau, P; Rivière, JP
err分享
err收藏
Optimization and thermal stability of TiAlN/Mo multilayers
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2005-10-01
err17
errOAAI
errTavares, CJ; Vidrago, C; Rebouta, L; Rivière, JP; Le Bourhis, E; Denanot, MF
err分享
err收藏
An indentation method to measure the CRSS of semiconducting materials at elevated temperature
errMATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
IF7
err2005-07-01
err0
PREAI
errRivière, JP; Largeau, L; Patriarche, G; Le Bourhis, E
err分享
err收藏
Conservative indentation flow throughout thin (011) InP foils
errJOURNAL OF MATERIALS SCIENCE
IF3.9
err2005-07-01
err0
PREAI
errLargeau, L; Patriarche, G; Le Bourhis, E; Riviere, JP
err分享
err收藏
Polarity influence on the indentation punching of thin {111} GaAs foils at elevated temperatures
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2005-04-02
err4
PREAI
errPatriarche, G; Largeau, L; Rivière, JP; Le Bourhis, E
err分享
err收藏
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2005-02-01
err168
errOAAI
errVaz, F; Ferreira, J; Ribeiro, E; Rebouta, L; Lanceros-Méndez, S; Mendes, JA; Alves, E; Goudeau, P; Rivière, JP; Ribeiro, F; Moutinho, I; Pischow, K; de Rijk, J
err分享
err收藏
Characterization of hard DC-sputtered Si-based TiN coatings:: the effect of composition and ion bombardment
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2004-11-01
err42
PREAI
errRibeiro, E; Rebouta, L; Carvalho, S; Vaz, F; Fuentes, GG; Rodriguez, R; Zazpe, M; Alves, E; Goudeau, P; Rivière, JP
err分享
err收藏
Atomic environment and interfacial structural order of TiAlN/Mo multilayers
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2004-10-01
err13
errOAAI
errTavares, CJ; Rebouta, L; Rivière, JP; Girardeau, T; Goudeau, P; Alves, E; Barradas, NP
err分享
err收藏
Structural and corrosion behaviour of stoichiometric and substoichiometric TiN thin films
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2004-03-01
err48
errOAAI
errRocha, LA; Ariza, E; Ferreira, J; Vaz, E; Ribeiro, E; Rebouta, L; Alves, E; Ramos, AR; Goudeau, P; Rivière, JP
err分享
err收藏
Indentation punching through thin (011)InP
errJOURNAL OF MATERIALS SCIENCE
IF3.9
err2004-02-01
err15
PREAI
errLargeau, L; Patriarche, G; Riviere, A; Riviere, JP; Le Bourhis, E
err分享
err收藏
Preparation of magnetron sputtered TiNxOy thin films
errSURFACE & COATINGS TECHNOLOGY
IF6.1
err2003-09-01
err75
PREAI
errVaz, F; Cerqueira, P; Rebouta, L; Nascimento, SMC; Alves, E; Goudeau, P; Rivière, JE
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
S
S. Lanceros‐Méndez
H 指数: 98 · 论文数: 1.3K
G
G. Patriarche
H 指数: 66 · 论文数: 1.1K
A
Agustín R. González‐Elipe
H 指数: 62 · 论文数: 635
E
E. Alves
H 指数: 60 · 论文数: 983
D
Daniel Bellet
H 指数: 53 · 论文数: 409
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