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K

K.R. Koops

VSL Dutch Metrology Institute

6H指数
18论文数
102被引数
收录论文 2
发表时间
Directional Repetitive Control of a Metrological AFM
err2011-11-01
err8
PREAI
errMerry, Roel J. E.; Ronde, Michael J. C.; van de Molengraft, Rene; Koops, K. Richard; Steinbuch, Maarten
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Intercomparison of scanning probe microscopes
err2002-07-01
err24
PREAI
errBreil, R; Fries, T; Garnaes, J; Haycocks, J; Hüser, D; Joergensen, J; Kautek, W; Koenders, L; Kofod, N; Koops, KR; Korntner, R; Lindner, B; Mirandé, W; Neubauer, A; Peltonen, J; Picotto, GB; Pisani, M; Rothe, H; Sahre, M; Stedman, M; Wilkening, G
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