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M

M. P. Kothiyal

indian institute of technology system (iit system)

27H指数
131论文数
2.3K被引数
收录论文 13
发表时间
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Multi-colour microscopic interferometry for optical metrology and imaging applications用于光学计量和成像应用的多色显微干涉测量
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2016-09-01
err26
errOAAI
errUpputuri, Paul Kumar; Pramanik, Manojit; Nandigana, Krishna Mohan; Kothiyal, Mahendra Prasad
err分享
err收藏
Measurement of large discontinuities using single white light interferogram
errOPTICS EXPRESS
IF3.3
err2014-10-28
err30
errOAAI
errUpputuri, Paul Kumar; Gong, Li; Wang, Haifeng; Pramanik, Manojit; Nandigana, Krishna Mohan; Kothiyal, Mahendra Prasad
err分享
err收藏
White light interferometry for surface profiling with a colour CCD
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2012-08-01
err55
PREAI
errKumar, U. Paul; Wang Haifeng; Mohan, N. Krishna; Kothiyal, M. P.
err分享
err收藏
Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2009-11-01
err61
PREAI
errDebnath, Sanjit K.; Kothiyal, Mahendra P.; Kim, Seung-Woo
err分享
err收藏
Two-wavelength micro-interferometry for 3-D surface profiling
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2009-02-01
err68
PREAI
errKumar, U. Paul; Bhaduri, Basanta; Kothiyal, M. P.; Mohan, N. Krishna
err分享
err收藏
Low power optical limiting in ClAl-Phthalocyanine due to self defocusing and self phase modulation effects
errOPTICAL MATERIALS
IF4.2
err2008-09-01
err67
PREAI
errSathiyamoorthy, K.; Vijayan, C.; Kothiyal, M. P.
err分享
err收藏
Microscopic TV holography for MEMS deflection and 3-D surface profile characterization
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err2008-09-01
err28
PREAI
errKumar, U. Paul; Bhaduri, Basanta; Mohan, N. Krishna; Kothiyal, M. P.; Asundi, A. K.
err分享
err收藏
Design of a low power optical limiter based on a new nanocomposite material incorporating silica-encapsulated phthalocyanine in Nafion
errJOURNAL OF PHYSICS D-APPLIED PHYSICS
IF3.2
err2007-09-21
err22
PREAI
errSathiyamoorthy, K.; Vijayan, C.; Kothiyal, M. P.
err分享
err收藏
Spectrally resolved phase-shifting interferometry for accurate group-velocity dispersion measurements
errOPTICS LETTERS
IF3.3
err2006-10-11
err2
PREAI
errDelmath, Sanjit K.; Viswanathan, Nirmal K.; Kothiyal, Mahendra P.
err分享
err收藏
Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)
errOPTICS EXPRESS
IF3.3
err2006-01-01
err116
errOAAI
errBhaduri, Basanta; Mohan, N. Krishna; Kothiyal, M. P.; Sirohi, R. S.
err分享
err收藏
Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates
errOPTICS EXPRESS
IF3.3
err2006-01-01
err64
errOAAI
errDebnath, Sanjit K.; Kothiyal, Mahendra P.; Schmit, Joanna
err分享
err收藏
Assessment of surface geometry using confocal scanning optical microscope
errMECHATRONICS
IF3.1
err1998-04-01
err11
PREAI
errUdupa, G; Singaperumal, M; Sirohi, RS; Kothiyal, MP
err分享
err收藏
Speckle photography with BaTiO3 crystal for the measurement of in-plane displacement field distribution of distant objects
errOPTICS AND LASERS IN ENGINEERING
IF3.7
err1998-03-01
err6
PREAI
errMohan, NK; Darlin, JS; Ara, MHM; Kothiyal, MP; Sirohi, RS
err分享
err收藏

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