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T

T. Dobashi

hitachi limited

6H指数
27论文数
143被引数
收录论文 5
发表时间
Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes
err2011-04-26
err21
errOAAI
errKamimura, Osamu; Maehara, Yosuke; Dobashi, Takashi; Kobayashi, Keita; Kitaura, Ryo; Shinohara, Hisanori; Shioya, Hiroyuki; Gohara, Kazutoshi
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Beam-divergence deconvolution for diffractive imaging
err2010-02-09
err8
errOAAI
errKawahara, Kota; Gohara, Kazutoshi; Maehara, Yosuke; Dobashi, Takashi; Kamimura, Osamu
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Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
err2008-01-15
err35
errOAAI
errKamimura, Osamu; Kawahara, Kota; Doi, Takahisa; Dobashi, Takashi; Abe, Takashi; Gohara, Kazutoshi
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Electronic structure of quasi-one-dimensional conductors Nb3X4 (X=S,Se,Te) studied by angle-resolved photoemission spectroscopy
err2007-07-30
err5
PREAI
errDobashi, T.; Sato, T.; Souma, S.; Takahashi, T.; Kaneko, H.; Ishihara, Y.; Okamoto, H.
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Shadow bands in single-layered Bi2Sr2CuO6+δ studied by angle-resolved photoemission spectroscopy
err2006-08-11
err32
errOAAI
errNakayama, K.; Sato, T.; Dobashi, T.; Terashima, K.; Souma, S.; Matsui, H.; Takahashi, T.; Campuzano, J. C.; Kudo, K.; Sasaki, T.; Kobayashi, N.; Kondo, T.; Takeuchi, T.; Kadowaki, K.; Kofu, M.; Hirota, K.
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