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William T. Estler

national institute of standards & technology (nist) - usa

19H指数
69论文数
2.5K被引数
收录论文 6
发表时间
Dimensional artefacts to achieve metrological traceability in advanced manufacturing
err2020-01-01
err61
errOAAI
errCarmignato, S.; De Chiffre, L.; Bosse, H.; Leach, R. K.; Balsamo, A.; Estler, W. T.
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Advances in Large-Scale Metrology - Review and future trends
err2016-01-01
err210
PREAI
errSchmitt, R. H.; Peterek, M.; Morse, E.; Knapp, W.; Galetto, M.; Haertig, F.; Goch, G.; Hughes, B.; Forbes, A.; Estler, W. T.
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Measurement technologies for precision positioning
err2015-01-01
err467
PREAI
errGao, W.; Kim, S. W.; Bosse, H.; Haitjema, H.; Chena, Y. L.; Lu, X. D.; Knapp, W.; Weckenmann, A.; Estler, W. T.; Kunzmann, H.
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Large-scale metrology - An update大尺度计量-更新
err2002-01-01
err223
PREAI
errEstler, WT; Edmundson, KL; Peggs, GN; Parker, DH
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Contribution of CIRP to the development of metrology and surface quality evaluation during the last fifty years
err2001-01-01
err42
PREAI
errPeters, J; Bryan, JB; Estler, WT; Evans, C; Kunzmann, H; Lucca, DA; Sartori, S; Sato, H; Thwaite, EG; Vanherck, P
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