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收藏Advances in Large-Scale Metrology - Review and future trends
Schmitt, R. H.; Peterek, M.; Morse, E.; Knapp, W.; Galetto, M.; Haertig, F.; Goch, G.; Hughes, B.; Forbes, A.; Estler, W. T.
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收藏Measurement technologies for precision positioning
Gao, W.; Kim, S. W.; Bosse, H.; Haitjema, H.; Chena, Y. L.; Lu, X. D.; Knapp, W.; Weckenmann, A.; Estler, W. T.; Kunzmann, H.
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收藏Contribution of CIRP to the development of metrology and surface quality evaluation during the last fifty years
Peters, J; Bryan, JB; Estler, WT; Evans, C; Kunzmann, H; Lucca, DA; Sartori, S; Sato, H; Thwaite, EG; Vanherck, P
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