未登录Dependence of radiative and nonradiative recombination on carrier density and Al content in thick AlGaN epilayers
Podlipskas, Z.; Aleksiejunas, R.; Kadys, A.; Mickevicius, J.; Jurkevicius, J.; Tamulaitis, G.; Shur, M.; Shatalov, M.; Yang, J.; Gaska, R.
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收藏Current-induced degradation of high performance deep ultraviolet light emitting diodes
Moe, Craig G.; Reed, Meredith L.; Garrett, Gregory A.; Sampath, Anand V.; Alexander, Troy; Shen, Hongen; Wraback, Michael; Bilenko, Yuriy; Shatalov, Maxim; Yang, Jinwei; Sun, Wenhong; Deng, Jianyu; Gaska, Remis
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收藏Migration enhanced lateral epitaxial overgrowth of AlN and AlGaN for high reliability deep ultraviolet light emitting diodes
Jain, R.; Sun, W.; Yang, J.; Shatalov, M.; Hu, X.; Sattu, A.; Lunev, A.; Deng, J.; Shturm, I.; Bilenko, Y.; Gaska, R.; Shur, M. S.
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收藏AlGaN-based 280 nm light-emitting diodes with continuous-wave power exceeding 1 mW at 25 mA
Zhang, JP; Hu, X; Bilenko, Y; Deng, J; Lunev, A; Shur, MS; Gaska, R; Shatalov, M; Yang, JW; Khan, MA
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