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收藏Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect
Urakawa, Satoshi; Tomai, Shigekazu; Ueoka, Yoshihiro; Yamazaki, Haruka; Kasami, Masashi; Yano, Koki; Wang, Dapeng; Furuta, Mamoru; Horita, Masahiro; Ishikawa, Yasuaki; Uraoka, Yukiharu
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