Peter J. de Groot - Publications, H-index & Citations

Peter J. de Groot

zygo corporation

38H指数

194论文数

6.0K被引数

收录论文 9

发表时间

International comparison of flatness deviation in areal surface topography measurements

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2022-01-01

OAAI

Vanrusselt, Maxim; Haitjema, Han; Leach, Richard; de Groot, Peter

Surface measuring coherence scanning interferometry beyond the specular reflection limit

OPTICS EXPRESS

IF3.3

2021-10-19

OAAI

Thomas, Matthew; Su, Rong; de Groot, Peter; Coupland, Jeremy; Leach, Richard

A review of selected topics in interferometric optical metrology 干涉光学计量中选定主题的回顾

REPORTS ON PROGRESS IN PHYSICS

IF20.7

2019-04-23

PREAI

de Groot, Peter J.

Principles of interference microscopy for the measurement of surface topography

ADVANCES IN OPTICS AND PHOTONICS

IF23.8

2015-02-02

309

PREAI

de Groot, Peter

Temperature control of Fano resonances and transmission in superconducting metamaterials

OPTICS EXPRESS

IF3.3

2010-04-14

129

OAAI

Fedotov, V. A.; Tsiatmas, A.; Shi, J. H.; Buckingham, R.; de Groot, P.; Chen, Y.; Wang, S.; Zheludev, N. I.

Current driven dynamics of domain walls constrained in ferromagnetic nanopillars

PHYSICAL REVIEW B

IF3.7

2008-08-29

OAAI

Franchin, Matteo; Fischbacher, Thomas; Bordignon, Giuliano; de Groot, Peter; Fangohr, Hans

Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling

OPTICS EXPRESS

IF3.3

2008-03-10

OAAI

de Groot, Peter; de Lega, Xavier Colonna; Liesener, Jan; Darwin, Michael

Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry

OPTICS LETTERS

IF3.3

2007-06-05

PREAI

de Groot, Peter; Colonna de Lega, Xavier

The electrochemical deposition of nanostructured cobalt films from lyotropic liquid crystalline media

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2001-01-01

114

PREAI

Bartlett, PN; Birkin, PN; Ghanem, MA; de Groot, P; Sawicki, M

研究方向