arrow
返回
A

Andrey Yakshin

euratom

24H指数
150论文数
1.9K被引数
收录论文 26
发表时间
Unveiling the effect of adding B4C at the W-on-Si interface揭示在W-on-Si界面添加B4C的影响
err2025-08-19
err0
errOAAI
errAdele Valpreda; Hendrik W. Lokhorst; Jacobus M. Sturm; Andrey E. Yakshin; Marcelo Ackermann
err分享
err收藏
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis
err2024-10-01
err1
errOAAI
errValpreda, Adele; Sturm, Jacobus M.; Yakshin, Andrey E.; Woitok, Joachim; Lokhorst, Hendrik W.; Phadke, Parikshit; Ackermann, Marcelo
err分享
err收藏
Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr0.52Ti0.48O3 Films
err2022-06-17
err2
errOAAI
errLucke, Philip; Nematollahi, Mohammadreza; Bayraktar, Muharrem; Yakshin, Andrey E.; ten Elshof, Johan E.; Bijkerk, Fred
err分享
err收藏
Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3Films: A Polarization Rotation Model
err2020-09-23
err5
errOAAI
errLucke, Philip; Bayraktar, Muharrem; Birkholzer, Yorick A.; Nematollahi, Mohammadreza; Yakshin, Andrey; Rijnders, Guus; Bijkerk, Fred; Houwman, Evert P.
err分享
err收藏
Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics
err2019-10-15
err5
errOAAI
errNematollahi, Mohammadreza; Lucke, Philip; Bayraktar, Muharrem; Yakshin, Andrey; Rijnders, Guus; Bijkerk, Fred
err分享
err收藏
Double matrix effect in Low Energy Ion Scattering from La surfacesLa表面低能离子散射的双矩阵效应
err2018-05-01
err12
errOAAI
errZameshin, Andrey A.; Yakshin, Andrey E.; Sturm, Jacobus M.; Brongerma, Hidde H.; Bijkerk, Fred
err分享
err收藏
Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics
err2017-03-21
err91
errOAAI
errHuang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert; Yakshin, Andrey; Louis, Eric; Bijkerk, Fred
err分享
err收藏
High-reflectance La/B-based multilayer mirror for 6.x nm wavelength
err2015-08-07
err55
errOAAI
errKuznetsov, D. S.; Yakshin, A. E.; Sturm, J. M.; van de Kruijs, R. W. E.; Louis, E.; Bijkerk, F.
err分享
err收藏
Wideband multilayer mirrors with minimal layer thicknesses variation
err2015-04-02
err29
errOAAI
errKozhevnikov, I. V.; Yakshin, A. E.; Bijkerk, F.
err分享
err收藏
Surface and sub-surface thermal oxidation of thin ruthenium films
err2014-10-01
err23
errOAAI
errRibera, R. Coloma; van de Kruijs, R. W. E.; Kokke, S.; Zoethout, E.; Yakshin, A. E.; Bijkerk, F.
err分享
err收藏
Subwavelength single layer absorption resonance antireflection coatings
err2014-01-03
err20
errOAAI
errHuber, S. P.; van de Kruijs, R. W. E.; Yakshin, A. E.; Zoethout, E.; Boller, K. -J.; Bijkerk, F.
err分享
err收藏
Multilayer mirror with enhanced spectral selectivity for the next generation extreme ultraviolet lithography
err2013-11-27
err9
PREAI
errMedvedev, V. V.; van de Kruijs, R. W. E.; Yakshin, A. E.; Novikova, N. N.; Krivtsun, V. M.; Louis, E.; Yakunin, A. M.; Bijkerk, F.
err分享
err收藏
err分享
err收藏
Infrared diffractive filtering for extreme ultraviolet multilayer Bragg reflectors
err2013-07-09
err17
errOAAI
errMedvedev, V. V.; van den Boogaard, A. J. R.; van der Meer, R.; Yakshin, A. E.; Louis, E.; Krivtsun, V. M.; Bijkerk, F.
err分享
err收藏
Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors
err2012-03-23
err11
errOAAI
errMedvedev, V. V.; Yakshin, A. E.; van de Kruijs, R. W. E.; Krivtsun, V. M.; Yakunin, A. M.; Koshelev, K. N.; Bijkerk, F.
err分享
err收藏
Nanometer interface and materials control for multilayer EUV-optical applications
err2011-12-01
err134
PREAI
errLouis, E.; Yakshin, A. E.; Tsarfati, T.; Bijkerk, F.
err分享
err收藏
Infrared suppression by hybrid EUV multilayer-IR etalon structures
err2011-08-19
err12
PREAI
errMedvedev, V. V.; Yakshin, A. E.; van de Kruijs, R. W. E.; Krivtsun, V. M.; Yakunin, A. M.; Koshelev, K. N.; Bijkerk, F.
err分享
err收藏
Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection
err2011-05-01
err13
errOAAI
errde Rooij-Lohmann, V. I. T. A.; Yakshin, A. E.; Zoethout, E.; Verhoeven, J.; Bijkerk, F.
err分享
err收藏
In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films
err2011-01-01
err15
errOAAI
errBruijn, S.; van de Kruijs, R. W. E.; Yakshin, A. E.; Bijkerk, F.
err分享
err收藏