Yoichi Miyahara - Publications, H-index & Citations

Yoichi Miyahara

Texas State University System

23H指数

122论文数

1.6K被引数

收录论文 33

发表时间

Improving the electrical conductivity of Pt nanowires deposited by focused electron beam induced deposition using thermal annealing 通过热退火改善聚焦电子束诱导沉积法制备的Pt纳米线的电导率

Nanotechnology

IF2.8

2026-03-06

OAAI

Rajendra Rai; Ujjwal Dhakal; Binod D C; Yoichi Miyahara

Magnetism in Pt/Co/Cu multilayers: dependence on Co thickness and the influence of additional superconducting Nb layers Pt/Co/Cu多层膜中的磁性：对Co层厚度的依赖性及额外超导Nb层的影响

Materials Research Express

IF2.2

2026-01-28

PREAI

Khanal, Bijay; Mock, Sydney K.; Bag, Niraj; Hasan, Md Mahamudul; Austin-Bingamon, Noah L.; Miyahara, Yoichi; Satchell, Nathan

Moiré ferroelectricity modulates light emission from a semiconductor monolayer 莫尔铁电性调制半导体单层的光发射

SCIENCE ADVANCES

IF12.5

2025-05-09

OAAI

Kim, Dong Seob; Xiao, Chengxin; Dominguez, Roy C.; Liu, Zhida; Abudayyeh, Hamza; Lee, Kyoungpyo; Mayorga-Luna, Rigo; Kim, Hyunsue; Watanabe, Kenji; Taniguchi, Takashi; Shih, Chih-Kang; Miyahara, Yoichi; Yao, Wang; Li, Xiaoqin

Electrostatic moire potential from twisted hexagonal boron nitride layers 扭曲的六方氮化硼层的静电莫尔电位

NATURE MATERIALS

IF38.5

2023-08-10

PREAI

Kim, Dong Seob; Dominguez, Roy C.; Mayorga-Luna, Rigo; Ye, Dingyi; Embley, Jacob; Tan, Tixuan; Ni, Yue; Liu, Zhida; Ford, Mitchell; Gao, Frank Y. Y.; Arash, Saba; Watanabe, Kenji; Taniguchi, Takashi; Kim, Suenne; Shih, Chih-Kang; Lai, Keji; Yao, Wang; Yang, Li; Li, Xiaoqin; Miyahara, Yoichi

Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island

ACS NANO

IF16

2021-05-28

OAAI

Schumacher, Zeno; Rejali, Rasa; Cowie, Megan; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter

Nanoscale force sensing of an ultrafast nonlinear optical response

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

IF9.1

2020-08-04

OAAI

Schumacher, Zeno; Rejali, Rasa; Pachlatko, Raphael; Spielhofer, Andreas; Nagler, Philipp; Miyahara, Yoichi; Cooke, David G.; Grutter, Peter

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy 共振频率的振幅依赖性及其对扫描探针显微镜的影响

SENSORS

IF3.5

2019-10-17

OAAI

Dagdeviren, Omur E.; Miyahara, Yoichi; Mascaro, Aaron; Enright, Tyler; Grutter, Peter

Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface 在金属界面的单个氧化还原分子中观察到的完全量化的电子转移

NANO LETTERS

IF9.1

2019-08-20

PREAI

Roy-Gobeil, Antoine; Miyahara, Yoichi; Bevan, Kirk H.; Grutter, Peter

Nanopore Formation via Tip-Controlled Local Breakdown Using an Atomic Force Microscope

SMALL METHODS

IF9.1

2019-04-24

PREAI

Zhang, Yuning; Miyahara, Yoichi; Derriche, Nassim; Yang, Wayne; Yazda, Khadija; Capaldi, Xavier; Liu, Zezhou; Grutter, Peter; Reisner, Walter

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

BEILSTEIN JOURNAL OF NANOTECHNOLOGY

IF2.7

2019-03-01

OAAI

Mascaro, Aaron; Miyahara, Yoichi; Enright, Tyler; Dagdeviren, Omur E.; Gruetter, Peter

Eliminating the effect of acoustic noise on cantilever spring constant calibration

APPLIED PHYSICS LETTERS

IF3.6

2018-12-07

OAAI

Mascaro, Aaron; Miyahara, Yoichi; Dagdeviren, Omur E.; Grutter, Peter

Relating Franck-Condon blockade to redox chemistry in the single-particle picture

JOURNAL OF CHEMICAL PHYSICS

IF3.1

2018-09-14

OAAI

Bevan, Kirk H.; Roy-Gobeil, Antoine; Miyahara, Yoichi; Grutter, Peter

Influence of Environmentally Relevant Physicochemical Conditions on a Highly Efficient Inorganic Ice Nucleating Particle 与环境相关的物理化学条件对高效无机冰成核颗粒的影响

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2018-08-01

PREAI

Ganguly, Mainak; Dib, Simon; Kurien, Uday; Rangel-Alvarado, Rodrigo Benjamin; Miyahara, Yoichi; Ariya, Parisa A.

Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy 使用原子力显微镜测量锂电池阴极上的空间分辨集体离子传输

NANO LETTERS

IF9.1

2017-06-21

PREAI

Mascaro, Aaron; Wang, Zi; Hovington, Pierre; Miyahara, Yoichi; Paolella, Andrea; Gariepy, Vincent; Feng, Zimin; Enright, Tyler; Aiken, Connor; Zaghib, Karim; Bevan, Kirk H.; Grutter, Peter

Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

APPLIED PHYSICS LETTERS

IF3.6

2017-04-20

OAAI

Miyahara, Yoichi; Grutter, Peter

The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach

APPLIED PHYSICS LETTERS

IF3.6

2017-02-02

OAAI

Schumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter