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Multiscale Fabrication and Characterization of a NEMS Force Sensor Jedari Ghourichaei, Masoud; Kerimzade, Umut; Demirkazik, Levent; Pruchnik, Bartosz; Kwoka, Krzysztof; Badura, Dominik; Piasecki, Tomasz; Toymus, Alp Timucin; Aydin, Onur; Aksoy, Bekir; Aydogan, Cemal; Nadar, Gokhan; Rangelow, Ivo W.; Beker, Levent; Yalcinkaya, Arda Deniz; Bayraktar, Halil; Gotszalk, Teodor; Alaca, Burhanettin Erdem 分享 收藏
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Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy (vol 188, 110373, 2022) Gacka, Ewelina; Kunicki, Piotr; Sikora, Andrzej; Bogdanowicz, Robert; Ficek, Mateusz; Gotszalk, Teodor; Rangelow, Ivo W.; Kwoka, Krzysztof 分享 收藏
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Advanced Scanning Probe Nanolithography Using GaN Nanowires 使用GaN纳米线的高级扫描探针纳米光刻 Behzadirad, Mahmoud; Mecholdt, Stephan; Randall, John N.; Ballard, Joshua B.; Owen, James; Rishinaramangalam, Ashwin K.; Reum, Alexander; Gotszalk, Teodor; Feezell, Daniel F.; Rangelow, Ivo W.; Busani, Tito 分享 收藏
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Encased Cantilevers and Alternative Scan Algorithms for Ultra-Gantle High Speed Atomic Force Microscopy Ashby, Paul; Ziegler, Dominik; Frank, Andreas; Frank, Sindy; Chen, Alex; Meyer, Travis; Farnham, Rodrigo; Nen Huynh; Rangelow, Ivo; Chang, Jen-Mei; Bertozzi, Andrea 分享 收藏
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