arrow
返回
Z

Zeno Schumacher

McGill University

8H指数
22论文数
152被引数
收录论文 10
发表时间
Single-dopant band bending fluctuations in MoSe2 measured with electrostatic force microscopy
err2022-10-11
err6
errOAAI
errCowie, Megan; Plougmann, Rikke; Schumacher, Zeno; Gruetter, Peter
err分享
err收藏
Few-Femtosecond Dynamics of Free-Free Opacity in Optically Heated Metals
err2022-05-25
err16
errOAAI
errNiedermayr, A.; Volkov, M.; Sato, S. A.; Hartmann, N.; Schumacher, Z.; Neb, S.; Rubio, A.; Gallmann, L.; Keller, U.
err分享
err收藏
Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island
err2021-05-28
err5
errOAAI
errSchumacher, Zeno; Rejali, Rasa; Cowie, Megan; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter
err分享
err收藏
Nanoscale force sensing of an ultrafast nonlinear optical response
err2020-08-04
err6
errOAAI
errSchumacher, Zeno; Rejali, Rasa; Pachlatko, Raphael; Spielhofer, Andreas; Nagler, Philipp; Miyahara, Yoichi; Cooke, David G.; Grutter, Peter
err分享
err收藏
Phase stabilization of an attosecond beamline combining two IR colors
err2019-07-23
err11
errOAAI
errSchlaepfer, F.; Volkov, M.; Hartmann, N.; Niedermayr, A.; Schumacher, Z.; Gallmann, L.; Keller, U.
err分享
err收藏
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
err2017-02-02
err45
errOAAI
errSchumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter
err分享
err收藏
Sensitivity measurement of a cantilever-based surface stress sensor
err2016-10-19
err2
PREAI
errHaag, Ann-Lauriene; Schumacher, Zeno; Grutter, Peter
err分享
err收藏
Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination
err2016-04-28
err40
PREAI
errSchumacher, Zeno; Miyahara, Yoichi; Spielhofer, Andreas; Grutter, Peter
err分享
err收藏
Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation
err2015-11-23
err22
errOAAI
errMiyahara, Yoichi; Topple, Jessica; Schumacher, Zeno; Grutter, Peter
err分享
err收藏