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Z
Zeno Schumacher
McGill University
8
H指数
22
论文数
152
被引数
0
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10
发表时间
发表时间
IF
被引数
Ultrafast electron localization and screening in a transition metal dichalcogenide
过渡金属二硫族化物中的超快电子定位和筛选
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
IF
9.1
2023-04-04
4
OA
AI
Schumacher, Z.; Sato, S. A.; Neb, S.; Niedermayr, A.; Gallmann, L.; Rubio, A.; Keller, U.
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Single-dopant band bending fluctuations in MoSe2 measured with electrostatic force microscopy
PHYSICAL REVIEW MATERIALS
IF
3.4
2022-10-11
6
OA
AI
Cowie, Megan; Plougmann, Rikke; Schumacher, Zeno; Gruetter, Peter
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Few-Femtosecond Dynamics of Free-Free Opacity in Optically Heated Metals
PHYSICAL REVIEW X
IF
15.7
2022-05-25
16
OA
AI
Niedermayr, A.; Volkov, M.; Sato, S. A.; Hartmann, N.; Schumacher, Z.; Neb, S.; Rubio, A.; Gallmann, L.; Keller, U.
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Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island
ACS NANO
IF
16
2021-05-28
5
OA
AI
Schumacher, Zeno; Rejali, Rasa; Cowie, Megan; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter
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Nanoscale force sensing of an ultrafast nonlinear optical response
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
IF
9.1
2020-08-04
6
OA
AI
Schumacher, Zeno; Rejali, Rasa; Pachlatko, Raphael; Spielhofer, Andreas; Nagler, Philipp; Miyahara, Yoichi; Cooke, David G.; Grutter, Peter
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Phase stabilization of an attosecond beamline combining two IR colors
OPTICS EXPRESS
IF
3.3
2019-07-23
11
OA
AI
Schlaepfer, F.; Volkov, M.; Hartmann, N.; Niedermayr, A.; Schumacher, Z.; Gallmann, L.; Keller, U.
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The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
APPLIED PHYSICS LETTERS
IF
3.6
2017-02-02
45
OA
AI
Schumacher, Zeno; Spielhofer, Andreas; Miyahara, Yoichi; Grutter, Peter
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Sensitivity measurement of a cantilever-based surface stress sensor
JOURNAL OF CHEMICAL PHYSICS
IF
3.1
2016-10-19
2
PRE
AI
Haag, Ann-Lauriene; Schumacher, Zeno; Grutter, Peter
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Measurement of Surface Photovoltage by Atomic Force Microscopy under Pulsed Illumination
PHYSICAL REVIEW APPLIED
IF
4.4
2016-04-28
40
PRE
AI
Schumacher, Zeno; Miyahara, Yoichi; Spielhofer, Andreas; Grutter, Peter
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Kelvin Probe Force Microscopy by Dissipative Electrostatic Force Modulation
PHYSICAL REVIEW APPLIED
IF
4.4
2015-11-23
22
OA
AI
Miyahara, Yoichi; Topple, Jessica; Schumacher, Zeno; Grutter, Peter
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研究方向
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合作学者
合作期刊
Á
Ángel Rubio
H 指数: 128 · 论文数: 1.3K
U
U. Keller
H 指数: 102 · 论文数: 1.5K
P
Peter Grütter
H 指数: 53 · 论文数: 290
L
L. Gallmann
H 指数: 43 · 论文数: 234
S
Shunsuke Sato
H 指数: 37 · 论文数: 298
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