Jeremiah Croshaw - Publications, H-index & Citations

Jeremiah Croshaw

university of alberta

7H指数

21论文数

319被引数

收录论文 7

发表时间

Atomically Precise Manufacturing of Silicon Electronics 硅电子的原子精确制造

ACS NANO

IF16

2024-02-20

OAAI

Pitters, Jason; Croshaw, Jeremiah; Achal, Roshan; Livadaru, Lucian; Ng, Samuel; Lupoiu, Robert; Chutora, Taras; Huff, Taleana; Walus, Konrad; Wolkow, Robert A.

Ionic charge distributions in silicon atomic surface wires

NANOSCALE

IF5.1

2021-01-01

OAAI

Croshaw, Jeremiah; Huff, Taleana; Rashidi, Mohammad; Wood, John; Lloyd, Erika; Pitters, Jason; Wolkow, Robert A.

Deep learning-guided surface characterization for autonomous hydrogen lithography

MACHINE LEARNING-SCIENCE AND TECHNOLOGY

IF4.6

2020-03-18

OAAI

Rashidi, Mohammad; Croshaw, Jeremiah; Mastel, Kieran; Tamura, Marcus; Hosseinzadeh, Hedieh; Wolkow, Robert A.

Detecting and Directing Single Molecule Binding Events on H-Si(100) with Application to Ultradense Data Storage

ACS NANO

IF16

2019-11-27

OAAI

Achal, Roshan; Rashidi, Mohammad; Croshaw, Jeremiah; Huff, Taleana R.; Wolkow, Robert A.

Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum Dot

ACS NANO

IF16

2019-08-06

OAAI

Huff, Taleana R.; Dienel, Thomas; Rashidi, Mohammad; Achal, Roshan; Livadaru, Lucian; Croshaw, Jeremiah; Wolkow, Robert A.

Lithography for robust and editable atomic-scale silicon devices and memories

NATURE COMMUNICATIONS

IF15.7

2018-07-23

OAAI

Achal, Roshan; Rashidi, Mohammad; Croshaw, Jeremiah; Churchill, David; Taucer, Marco; Huff, Taleana; Cloutier, Martin; Pitters, Jason; Wolkow, Robert A.

Resolving and Tuning Carrier Capture Rates at a Single Silicon Atom Gap State

ACS NANO

IF16

2017-11-03

OAAI

Rashidi, Mohammad; Lloyd, Erika; Huff, Taleana R.; Achal, Roshan; Taucer, Marco; Croshaw, Jeremiah J.; Wolkow, Robert A.

研究方向