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Mark Buckwell

university college london

17H指数
95论文数
1.6K被引数
收录论文 24
发表时间
Supercapacitor Safety: Overcharge-Induced Failure Mechanisms in Electrochemical Double-Layer Capacitors超级电容器安全性:电化学双层电容器中过充电引起的失效机制
err2026-09-29
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errThomas Dore; Inez Kesuma; Abdus S. Ali; Jonas Pfaff; Yuxiao Jin; Rosalie Hamill; Mark Buckwell; Hamish Reid; Thomas Finco; Zeyu Sun; Yuanze Li; Sebastian Schopferer; Siegfried Nau; Nils Böttcher; Henning Markötter; Alexander J. E. Rettie; James Robinson; Paul R. Shearing; Alexander Rack; Thomas S. Miller
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4D insights into lithium-ion battery sidewall rupture during thermal runaway4D洞察热失控过程中锂离子电池侧壁破裂
err2026-02-05
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errMatilda Fransson; Ludovic Broche; Jonas Pfaff; Matteo Venturelli; Mark Buckwell; Arthur Fordham; Charlie Kirchner-Burles; Hamish T. Reid; Mahesh Thalwaththe Gedara; Sebastian Schopferer; Donal P. Finegan; James Robinson; Rhodri Jervis; Alexander Rack; Eric Darcy; Paul Shearing
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Safety and performance implications of lithium plating induced by sub-zero temperature cycling of lithium-ion batteries由锂离子电池零下温度循环引起的锂沉积的安全性和性能影响
err2025-10-08
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errCharles Kirchner-Burles; Arthur Fordham; Hamish T. Reid; Michael Johnson; Mark Buckwell; Francesco Iacoviello; Kofi Coke; Rhodri Jervis; Gareth Hinds; Paul R. Shearing; James B. Robinson
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Roadmap to neuromorphic computing with emerging technologies利用新兴技术实现神经形态计算的路线图
err2024-10-21
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errMehonic, Adnan; Ielmini, Daniele; Roy, Kaushik; Mutlu, Onur; Kvatinsky, Shahar; Serrano-Gotarredona, Teresa; Linares-Barranco, Bernabe; Spiga, Sabina; Savel'ev, Sergey; Balanov, Alexander G.; Chawla, Nitin; Desoli, Giuseppe; Malavena, Gerardo; Monzio Compagnoni, Christian; Wang, Zhongrui; Yang, J. Joshua; Sarwat, Syed Ghazi; Sebastian, Abu; Mikolajick, Thomas; Slesazeck, Stefan; Noheda, Beatriz; Dieny, Bernard; Hou, Tuo-Hung (Alex); Varri, Akhil; Brueckerhoff-Plueckelmann, Frank; Pernice, Wolfram; Zhang, Xixiang; Pazos, Sebastian; Lanza, Mario; Wiefels, Stefan; Dittmann, Regina; Ng, Wing H.; Buckwell, Mark; Cox, Horatio R. J.; Mannion, Daniel J.; Kenyon, Anthony J.; Lu, Yingming; Yang, Yuchao; Querlioz, Damien; Hutin, Louis; Vianello, Elisa; Chowdhury, Sayeed Shafayet; Mannocci, Piergiulio; Cai, Yimao; Sun, Zhong; Pedretti, Giacomo; Strachan, John Paul; Strukov, Dmitri; Le Gallo, Manuel; Ambrogio, Stefano; Valov, Ilia; Waser, Rainer
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The Role of Hydrogen in ReRAM
err2024-10-14
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errCox, Horatio R. J.; Sharpe, Matthew K.; McAleese, Callum; Laitinen, Mikko; Dulai, Jeevan; Smith, Richard; England, Jonathan; Ng, Wing H.; Buckwell, Mark; Zhao, Longfei; Fearn, Sarah; Mehonic, Adnan; Kenyon, Anthony J.
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Exploring thermal runaway propagation in Li-ion batteries through high-speed X-ray imaging and thermal analysis: Impact of cell chemistry and electrical connections通过高速x射线成像和热分析探索锂离子电池中的热失控传播: 电池化学和电气连接的影响
err2024-10-01
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errFransson, Matilda; Pfaff, Jonas; Broche, Ludovic; Buckwell, Mark; Kirchner-Burles, Charlie; Reid, Hamish T.; Schopferer, Sebastian; Rack, Alexander; Finegan, Donal P.; Shearing, Paul R.
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High-Speed Imaging for Investigating Battery Failure Mechanisms
err2024-09-01
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PREAI
errReid, Hamish T.; Kesuma, Inez; Buckwell, Mark; Robinson, James B.; Shearing, Paul R.
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Investigating the Performance and Safety of Li-Ion Cylindrical Cells Using Acoustic Emission and Machine Learning Analysis使用声发射和机器学习分析研究锂离子圆柱电池的性能和安全性
err2024-07-11
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errFordham, Arthur; Joo, Seung-Bin; Owen, Rhodri E.; Galiounas, Elias; Buckwell, Mark; Brett, Dan J. L.; Shearing, Paul R.; Jervis, Rhodri; Robinson, James B.
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The battery failure databank: Insights from an open-access database of thermal runaway behaviors of Li-ion cells and a resource for benchmarking risks电池故障数据库: 来自锂离子电池热失控行为的开放访问数据库和基准风险资源的见解
err2024-03-01
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errFinegan, Donal P.; Billman, Julia; Darst, Jacob; Hughes, Peter; Trillo, Jesus; Sharp, Matt; Benson, Alex; Pham, Martin; Kesuma, Inez; Buckwell, Mark; Reid, Hamish T.; Kirchner-Burles, Charlie; Fransson, Matilda; Petrushenko, David; Heenan, Thomas M. M.; Jervis, Rhodri; Owen, Rhodri; Patel, Drasti; Broche, Ludovic; Rack, Alexander; Magdysyuk, Oxana; Keyser, Matt; Walker, William; Shearing, Paul; Darcy, Eric
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Up in smoke: Considerations for lithium-ion batteries in disposable e-cigarettes冒烟: 一次性电子烟中锂离子电池的注意事项
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IF35.4
err2023-12-01
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errReid, Hamish T.; Fordham, Arthur; Rasha, Lara; Buckwell, Mark; Brett, Daniel J. L.; Jervis, Rhodri; Shearing, Paul R.
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Sidewall breach during lithium-ion battery thermal runaway triggered by cell-to-cell propagation visualized using high-speed X-ray imaging使用高速x射线成像可视化的电池到电池传播触发的锂离子电池热失控期间的侧壁破裂
err2023-11-01
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errFransson, Matilda; Broche, Ludovic; Buckwell, Mark; Pfaff, Jonas; Reid, Hamish; Kirchner-Burles, Charlie; Pham, Martin; Moser, Stefan; Rack, Alexander; Nau, Siegfried; Schopferer, Sebastian; Finegan, Donal P.; Shearing, Paul
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In situ chamber for studying battery failure using high-speed synchrotron radiography使用高速同步辐射照相术研究电池故障的原位室
err2023-01-01
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errPfaff, Jonas; Fransson, Matilda; Broche, Ludovic; Buckwell, Mark; Finegan, Donal P.; Moser, Stefan; Schopferer, Sebastian; Nau, Siegfried; Shearing, Paul R.; Rack, Alexander
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Neuromorphic Dynamics at the Nanoscale in Silicon Suboxide RRAM
err2021-12-22
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errBuckwell, Mark; Ng, Wing H.; Mannion, Daniel J.; Cox, Horatio R. J.; Hudziak, Stephen; Mehonic, Adnan; Kenyon, Anthony J.
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A nanoscale analysis method to reveal oxygen exchange between environment, oxide, and electrodes in ReRAM devices
err2021-11-09
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errCox, Horatio R. J.; Buckwell, Mark; Ng, Wing H.; Mannion, Daniel J.; Mehonic, Adnan; Shearing, Paul R.; Fearn, Sarah; Kenyon, Anthony J.
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Simulation of Inference Accuracy Using Realistic RRAM Devices
err2019-06-12
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errMehonic, Adnan; Joksas, Dovydas; Ng, Wing H.; Buckwell, Mark; Kenyon, Anthony J.
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The interplay between structure and function in redox-based resistance switching
err2019-01-01
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errKenyon, Anthony J.; Munde, Manveer Singh; Ng, Wing H.; Buckwell, Mark; Joksas, Dovydas; Mehonic, Adnan
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On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials
err2018-11-12
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errChen, Shaochuan; Jiang, Lanlan; Buckwell, Mark; Jing, Xu; Ji, Yanfeng; Grustan-Gutierrez, Enric; Hui, Fei; Shi, Yuanyuan; Rommel, Mathias; Paskaleva, Albena; Benstetter, Guenther; Ng, Wing H.; Mehonic, Adnan; Kenyon, Anthony J.; Lanza, Mario
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Spike-Timing Dependent Plasticity in Unipolar Silicon Oxide RRAM Devices
err2018-02-08
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errZarudnyi, Konstantin; Mehonic, Adnan; Montesi, Luca; Buckwell, Mark; Hudziak, Stephen; Kenyon, Anthony J.
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