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Alfred J. Weymouth

University of Regensburg

15H指数
54论文数
924被引数
收录论文 24
发表时间
Sliding friction over individual aromatic bonds correlates with bond order芳香键的滑动摩擦与键级相关
err2026-04-22
err0
errOAAI
errShinjae Nam; Lukas Hörmann; Oliver Gretz; Oliver T. Hofmann; Franz J. Giessibl; Alfred J. Weymouth
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Role of doping in probe microscopies for the Si(111) 7 x 7 surface
err2025-02-27
err0
errOAAI
errFan, Dingxin; Sakai, Yuki; Chelikowsky, James R.; Meuer, Daniel; Weymouth, Alfred J.; Giessibl, Franz J.
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Decoding the surface of a complex oxide解码复杂氧化物的表面
errSCIENCE
IF45.8
err2024-09-13
err1
PREAI
errGiessibl, Franz J.; Weymouth, Alfred John
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Increasing the lifetime of confined electronic states in an artificial quantum structure
err2024-06-17
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PREAI
errWeiss, Marco; Schelchshorn, Michael; Stilp, Fabian; Weymouth, Alfred J.; Giessibl, Franz J.
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Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy
err2024-01-03
err0
errOAAI
errNam, Shinjae; Riegel, Elisabeth; Hoermann, Lukas; Hofmann, Oliver T.; Gretz, Oliver; Weymouth, Alfred J.; Giessibl, Franz J.
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Revealing buckling of an apparently flat monolayer of NaCl on Pt(111)
err2022-01-11
err1
errOAAI
errWeymouth, Alfred J.; Persson, Mats; Giessibl, Franz J.
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Lateral Force Microscopy Reveals the Energy Barrier of a Molecular Switch侧向力显微镜揭示了分子开关的能量势垒
err2021-02-01
err12
PREAI
errWeymouth, Alfred John; Riegel, Elisabeth; Simmet, Bianca; Gretz, Oliver; Giessibl, Franz J.
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Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip
err2020-08-24
err22
errOAAI
errLiebig, Alexander; Hapala, Prokop; Weymouth, Alfred J.; Giessibl, Franz J.
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Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors
err2018-06-19
err31
errOAAI
errPuerckhauer, Korbinian; Weymouth, Alfred J.; Pfeffer, Katharina; Kullmann, Lars; Mulvihill, Estefania; Krahn, Michael P.; Muller, Daniel J.; Giessibl, Franz J.
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Evaluating the potential energy landscape over single molecules at room temperature with lateral force microscopy
err2018-04-30
err7
PREAI
errWeymouth, Alfred J.; Riegel, Elisabeth; Matencio, Sonia; Giessibl, Franz J.
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Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy
err2016-10-05
err21
errOAAI
errOoe, Hiroaki; Kirpal, Dominik; Wastl, Daniel S.; Weymouth, Alfred J.; Arai, Toyoko; Giessibl, Franz J.
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Optimizing atomic resolution of force microscopy in ambient conditions
err2013-06-12
err59
errOAAI
errWastl, Daniel S.; Weymouth, Alfred J.; Giessibl, Franz J.
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Localization of the phantom force induced by the tunneling current
err2012-05-14
err11
errOAAI
errWutscher, Thorsten; Weymouth, Alfred J.; Giessibl, Franz J.
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Inhibiting molecular array formation on Si(111)-7 x 7 using site-selective Ge/Si exchange
err2012-04-20
err0
PREAI
errWeymouth, A. J.; McLean, A. B.; Miwa, R. H.; Srivastava, G. P.
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An Investigation of Ethylene Attachment to Si(111)-7 x 7 in the Restatom-Adatom Bridging Geometry: Electronic and Vibrational Properties
err2011-10-20
err6
PREAI
errMajzik, Z.; Kaminski, W.; Weymouth, A. J.; Vondracek, M.; Zobac, V.; Svec, M.; Berko, A.; McLean, A. B.; Prince, K. C.; Jelinek, P.; Chab, V.
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