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Stefan Witte

Vrije Universiteit Amsterdam

36H指数
252论文数
3.6K被引数
收录论文 62
发表时间
Material-Sensitive and Thickness-Resolved Transmission Imaging Using Coherent Extreme Ultraviolet Radiation使用相干极紫外辐射的材料敏感和厚度分辨透射成像
err2025-11-01
err0
PREAI
errZhang, Fengling; Liu, Xiaomeng; Pelekanidis, Antonios; Gouder, Matthias; Eikema, Kjeld S. E.; Witte, Stefan
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Generation Dynamics of Broadband Extreme Ultraviolet Vortex Beams宽带极紫外涡旋光束的产生动力学
err2025-02-28
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errOAAI
errPelekanidis, Antonios; Zhang, Fengling; Eikema, Kjeld S. E.; Witte, Stefan
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Breaking Abbe's diffraction limit with harmonic deactivation microscopy
err2024-11-15
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errOAAI
errMurzyn, Kevin; van der Geest, Maarten L. S.; Guery, Leo; Nie, Zhonghui; van Essen, Pieter; Witte, Stefan; Kraus, Peter M.
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Illumination diversity in multiwavelength extreme ultraviolet ptychography
err2024-11-13
err1
PREAI
errPelekanidis, Antonios; Zhang, Fengling; Gouder, Matthias; Seifert, Jacob; Du, Mengqi; Eikema, Kjeld s. e.; Witte, Stefan
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Characterizing post-compression of mJ-level ultrafast pulses via loose focusing in a gas cell
err2024-10-25
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errOAAI
errZhang, Fengling; Pelekanidis, Antonios; Karpavicius, Augustas; Gouder, Matthias; Seifert, Jacob; Eikema, Kjeld; Witte, Stefan
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Computational vibration mitigation using phase interpolation in digital holographic microscopy for overlay metrology
err2024-09-24
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errOAAI
errVan Gardingen-Cromwijk, Tamar; Konijnenberg, Sander; Witte, Stefan; De Boer, Johannes F.; Den Boef, Arie
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Mid-infrared optical parametric chirped-pulse amplifier at 50 W and 38 fs pumped by a high-power Yb-InnoSlab platform
err2024-09-23
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errOAAI
errBuss, Jan Heye; Starosielec, Sebastian; Schulz, Michael; Riedel, Robert; Campi, Filippo; Lehmann, Carl Stefan; Witte, Stefan; Kraus, Peter M.
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Sub-cycle dynamics in two-color high-harmonic generation from laser-produced plasmas
err2024-08-09
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errOAAI
errMathijssen, Jan; Salumbides, Edcel j.; Eikema, Kjeld s. e.; Witte, Stefan
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Fast spectroscopic imaging using extreme ultraviolet interferometry
err2024-07-25
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errOAAI
errStrauch, Hannah C.; Zhang, Fengling; Mathias, Stefan; Hohage, Thorsten; Witte, Stefan; Jansen, G. S. Matthijs
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Observation of chromatic effects in high-order harmonic generation
err2023-10-31
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errOAAI
errLiu, Xiaomeng; Pelekanidis, Antonios; Du, Mengqi; Zhang, Fengling; Eikema, Kjeld S. E.; Witte, Stefan
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PtyLab.m/py/jl: a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychographyPtyLab.m/py/jl: 一个跨平台的开源逆向建模工具箱,用于传统和傅立叶模式图
err2023-04-11
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errOAAI
errLoetgering, Lars; Du, Mengqi; Flaes, Dirk Boonzajer; Aidukas, Tomas; Wechsler, Felix; Molina, Daniel S. Penagos; Rose, Max; Pelekanidis, Antonios; Eschen, Wilhelm; Hess, Jurgen; Wilhein, Thomas; Heintzmann, Rainer; Rothhardt, Jan; Witte, Stefan
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High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams
errOPTICA
IF8.5
err2023-02-08
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errOAAI
errDu, Mengqi; Liu, Xiaomeng; Pelekanidis, Antonios; Zhang, Fengliang; Loetgering, Lars; Konold, Patrick; Porter, Christina L.; Smorenburg, Peter; Eikema, Kjeld S. E.; Witte, Stefan
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Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology
err2022-12-21
err5
errOAAI
errVan Gardingen-Cromwijk, Tamar; Adhikary, Manashee; Messinis, Christos; Konijnenberg, Sander; Coene, Wim; Witte, Stefan; de Boer, Johannes F.; den Boef, Arie
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aPIE: an angle calibration algorithm for reflection ptychography
err2022-04-06
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errOAAI
errde Beurs, Anne; Loetgering, Lars; Herczog, Milan; Du, Mengqi; Eikema, Kjeld S. E.; Witte, Stefan
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Enhancing the detection of laser-excited strain waves via transparent nanolayers
err2021-11-09
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errZhang, Hao; Antoncecchi, Alessandro; Edward, Stephen; Planken, Paul; Witte, Stefan
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Aberration calibration and correction with nano-scatterers in digital holographic microscopy for semiconductor metrology
err2021-11-02
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errOAAI
errMessinis, Christos; van Schaijk, Theodorus T. M.; Pandey, Nitesh; Koolen, Armand; Shlesinger, Ilan; Liu, Xiaomeng; Witte, Stefan; de Boer, Johannes F.; den Boef, Arie
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Spall-Velocity Reduction in Double-Pulse Impact on Tin Microdroplets
err2021-08-16
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errOAAI
errMeijer, Randy A.; Schupp, Ruben; Sheil, John; Basko, Mikhail M.; Eikema, Kjeld S. E.; Versolato, Oscar O.; Witte, Stefan
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