Andrew Yacoot - Publications, H-index & Citations

Andrew Yacoot

national physical laboratory, teddington, middlesex tw11 0lw, united kingdom

23H指数

107论文数

2.0K被引数

收录论文 9

发表时间

Measurement Science and Technology in 2025 2025年的测量科学与技术

Measurement Science and Technology

IF3.4

2025-12-18

PREAI

Andrew Yacoot

Reflecting on the role of National Metrology Institutes on the occasion of the 125th anniversary of the National Physical Laboratory 值国家物理实验室成立125周年之际，回顾国家计量研究所的作用

Measurement Science and Technology

IF3.4

2025-07-24

PREAI

Richard Brown; Andrew Yacoot

Microscope calibration using laser written fluorescence

OPTICS EXPRESS

IF3.3

2018-08-08

OAAI

Corbett, Alexander D.; Shaw, Michael; Yacoot, Andrew; Jefferson, Andrew; Schermelleh, Lothar; Wilson, Tony; Booth, Martin; Salter, Patrick S.

DNA nanomapping using CRISPR-Cas9 as a programmable nanoparticle

NATURE COMMUNICATIONS

IF15.7

2017-11-21

OAAI

Mikheikin, Andrey; Olsen, Anita; Leslie, Kevin; Russell-Pavier, Freddie; Yacoot, Andrew; Picco, Loren; Payton, Oliver; Toor, Amir; Chesney, Alden; Gimzewski, James K.; Mishra, Bud; Reed, Jason

Phase calibration target for quantitative phase imaging with ptychography

OPTICS EXPRESS

IF3.3

2016-03-31

OAAI

Godden, T. M.; Muniz-Piniella, A.; Claverley, J. D.; Yacoot, A.; Humphry, M. J.

Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester

APPLIED PHYSICS LETTERS

IF3.6

2016-02-01

OAAI

Lazzerini, Giovanni Mattia; Paterno, Giuseppe Maria; Tregnago, Giulia; Treat, Neil; Stingelin, Natalie; Yacoot, Andrew; Cacialli, Franco

Aspects of scanning force microscope probes and their effects on dimensional measurement

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2008-04-08

133

PREAI

Yacoot, Andrew; Koenders, Ludger

Advances in scanning force microscopy for dimensional metrology

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2006-01-01

120

PREAI

Danzebrink, H. -U.; Koenders, L.; Wilkening, G.; Yacoot, A.; Kunzmann, H.

A review of recent work in sub-nanometre displacement measurement using optical and X-ray interferometry

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

IF3.7

2002-05-15

PREAI

Peggs, GN; Yacoot, A

研究方向