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D. Théron

istituto per la microelettronica e microsistemi (imm-cnr)

25H指数
228论文数
2.4K被引数
收录论文 16
发表时间
Imaging Nanomechanical Vibrations and Manipulating Parametric Mode Coupling via Scanning Microwave Microscopy
err2024-07-02
err0
errOAAI
errXu, Hao; Venkatachalam, Srisaran; Rabenimanana, Toky-Harrison; Boyaval, Christophe; Eliet, Sophie; Braud, Flavie; Collin, Eddy; Theron, Didier; Zhou, Xin
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Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
err2024-01-01
err0
errOAAI
errHoffmann, Johannes; de Preville, Sophie; Eckmann, Bruno; Lin, Hung-Ju; Herzog, Benedikt; Haddadi, Kamel; Theron, Didier; Gramse, Georg; Richert, Damien; Moran-Meza, Jose; Piquemal, Francois
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A micro-electro-mechanical accelerometer based on gallium nitride on silicon
err2023-01-18
err4
errOAAI
errMorelle, C.; Theron, D.; Roch-Jeune, I.; Tilmant, P.; Okada, E.; Vaurette, F.; Grimbert, B.; Derluyn, J.; Degroote, S.; Germain, M.; Faucher, M.
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Estimation of π-π Electronic Couplings from Current Measurements
err2017-04-04
err37
errOAAI
errTrasobares, J.; Rech, J.; Jonckheere, T.; Martin, T.; Aleveque, O.; Levillain, E.; Diez-Cabanes, V.; Olivier, Y.; Cornil, J.; Nys, J. P.; Sivakumarasamy, R.; Smaali, K.; Leclere, P.; Fujiwara, A.; Theron, D.; Vuillaume, D.; Clement, N.
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A 17 GHz molecular rectifier
err2016-10-03
err88
errOAAI
errTrasobares, J.; Vuillaume, D.; Theron, D.; Clement, N.
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Modeling and de-embedding the interferometric scanning microwave microscopy by means of dopant profile calibration
err2015-12-01
err10
errOAAI
errMichalas, L.; Wang, F.; Brillard, C.; Chevalier, N.; Hartmann, J. M.; Marcelli, R.; Theron, D.
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Measurement Techniques for RF Nanoelectronic Devices
err2014-01-01
err46
PREAI
errHappy, Henri; Haddadi, Kamel; Theron, Didier; Lasri, Tuami; Dambrine, Gilles
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Detecting response of microelectromechanical resonators by microwave reflectometry
err2013-08-02
err10
errOAAI
errLegrand, B.; Ducatteau, D.; Theron, D.; Walter, B.; Tanbakuchi, H.
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Mapping charge transfers between quantum levels using noncontact atomic force microscopy
err2010-08-06
err13
PREAI
errBorowik, L.; Kusiaku, K.; Deresmes, D.; Theron, D.; Diesinger, H.; Melin, T.; Nguyen-Tran, T.; Roca i Cabarrocas, P.
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Calculating Kelvin force microscopy signals from static force fields
err2010-03-12
err26
errOAAI
errBorowik, Lukasz; Kusiaku, Koku; Theron, Didier; Melin, Thierry
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Amplified piezoelectric transduction of nanoscale motion in gallium nitride electromechanical resonators
err2009-06-10
err45
PREAI
errFaucher, Marc; Grimbert, Bertrand; Cordier, Yvon; Baron, Nicolas; Wilk, Arnaud; Lahreche, Hacene; Bove, Philippe; Francois, Marc; Tilmant, Pascal; Gehin, Thomas; Legrand, Christiane; Werquin, Matthieu; Buchaillot, Lionel; Gaquiere, Christophe; Theron, Didier
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Surface potential of n- and p-type GaN measured by Kelvin force microscopy
err2008-11-26
err76
PREAI
errBarbet, S.; Aubry, R.; di Forte-Poisson, M-A.; Jacquet, J-C.; Deresmes, D.; Melin, T.; Theron, D.
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Room-temperature terahertz emission from nanometer field-effect transistors
err2006-04-04
err132
PREAI
errDyakonova, N; El Fatimy, A; Lusakowski, J; Knap, W; Dyakonov, MI; Poisson, MA; Morvan, E; Bollaert, S; Shchepetov, A; Roelens, Y; Gaquiere, C; Theron, D; Cappy, A
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Electronic properties of deep defects in n-type GaNn型GaN中深缺陷的电子性质
err2004-10-01
err13
PREAI
errMuret, P; Ulzhöfer, C; Pernot, J; Cordier, Y; Semond, F; Gacquière, c; Théron, D
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