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Thomas M. Miller

United States Department of Defense

37H指数
261论文数
6.0K被引数
收录论文 73
发表时间
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Dissociative electron attachment and Ar+ reaction with chromium hexacarbonyl, 296-400 K
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2024-09-25
err0
PREAI
errMiller, Thomas M.; Rodriguez, Virginia G.; Ard, Shaun G.; Viggiano, Albert A.; Shuman, Nicholas S.
err分享
err收藏
The associative ionization of N(2P) + O(3P)
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2024-03-19
err1
errOAAI
errShuman, Nicholas S.; Miller, Thomas M.; Ard, Shaun G.; Viggiano, Albert A.
err分享
err收藏
Electron and Ar+ interaction with Mo(CO)6 at thermal energies; energetic limit on removal of 5 ligands from Mo(CO)6+
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2023-07-24
err1
PREAI
errMiller, Thomas M.; Lewis, Tucker W. R.; Ard, Shaun G.; Viggiano, Albert A.; Shuman, Nicholas S.
err分享
err收藏
Thermal rate constants for electron attachment to N2O: An example of endothermic attachment
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2020-08-18
err1
errOAAI
errSawyer, Jordan C.; Miller, Thomas M.; Ard, Shaun G.; Sweeny, Brendan C.; Viggiano, Albert A.; Shuman, Nicholas S.
err分享
err收藏
Toward a quantitative analysis of the temperature dependence of electron attachment to SF6
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2020-03-26
err1
errOAAI
errPoutsma, John C.; Shuman, Nicholas S.; Miller, Thomas M.; Troe, Juergen; Viggiano, Albert A.
err分享
err收藏
Reactions of C+ + Cl-, Br-, and I--A comparison of theory and experiment
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2019-12-23
err2
errOAAI
errSawyer, Jordan C.; Hedvall, Patrik; Miller, Thomas M.; Engeling, Kenneth W.; Larson, Asa; Orel, Ann E.; Viggiano, Albert A.; Shuman, Nicholas S.
err分享
err收藏
Mutual neutralization of H+ and D+ with the atomic halide anions Cl-, Br-, and I-
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2018-07-24
err5
errOAAI
errSawyer, Jordan C.; Miller, Thomas M.; Sweeny, Brendan C.; Ard, Shaun G.; Viggiano, Albert A.; Shuman, Nicholas S.
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Contrast between the mechanisms for dissociative electron attachment to CH3SCN and CH3NCS
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2018-05-09
err0
errOAAI
errMiller, Thomas M.; Viggiano, Albert A.; Shuman, Nicholas S.
err分享
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Probing the rate-determining region of the potential energy surface for a prototypical ion-molecule reaction探测原型离子分子反应的势能表面的速率确定区域
errPHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES
IF3.7
err2018-02-05
err3
errOAAI
errXie, Changjian; Liu, Xinguo; Sweeny, Brendan C.; Miller, Thomas M.; Ard, Shaun G.; Shuman, Nicholas S.; Viggiano, Albert A.; Guo, Hua
err分享
err收藏
Dissociative recombination of HCl+, H2Cl+, DCl+, and D2Cl+ in a flowing afterglow
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2016-12-28
err8
PREAI
errWiens, Justin P.; Miller, Thomas M.; Shuman, Nicholas S.; Viggiano, Albert A.
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Mutual neutralization of He+ with the anions Cl-, Br-, I-, and SF6-
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2016-05-31
err7
errOAAI
errWiens, Justin P.; Shuman, Nicholas S.; Miller, Thomas M.; Viggiano, Albert A.
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Electron attachment and positive ion chemistry of monohydrogenated fluorocarbon radicals
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2015-08-20
err3
errOAAI
errWiens, Justin P.; Shuman, Nicholas S.; Miller, Thomas M.; Viggiano, Albert A.
err分享
err收藏
Kinetics of ion-ion mutual neutralization: Halide anions with polyatomic cations
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2014-06-10
err24
PREAI
errShuman, Nicholas S.; Wiens, Justin P.; Miller, Thomas M.; Viggiano, Albert A.
err分享
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Mutual neutralization of atomic rare-gas cations (Ne+, Ar+, Kr+, Xe+) with atomic halide anions (Cl-, Br-, I-)
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2014-01-23
err15
PREAI
errShuman, Nicholas S.; Miller, Thomas M.; Johnsen, Rainer; Viggiano, Albert A.
err分享
err收藏
Electron attachment to C2 fluorocarbon radicals at high temperature
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2013-11-11
err3
PREAI
errShuman, Nicholas S.; Miller, Thomas M.; Viggiano, Albert A.
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Communication: Transfer ionization in a thermal reaction of a cation and anion: Ar+ with Br- and I-
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2013-11-01
err4
errOAAI
errShuman, Nicholas S.; Miller, Thomas M.; Johnsen, Rainer; Viggiano, Albert A.
err分享
err收藏
Electron attachment to CF3 and CF3Br at temperatures up to 890 K: Experimental test of the kinetic modeling approach
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2013-05-31
err12
errOAAI
errShuman, Nicholas S.; Miller, Thomas M.; Viggiano, Albert A.; Troe, Juergen
err分享
err收藏
Electron attachment to fluorocarbon radicals
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2012-12-07
err10
PREAI
errShuman, Nicholas S.; Miller, Thomas M.; Viggiano, A. A.
err分享
err收藏
Electron attachment to 14 halogenated alkenes and alkanes, 300-600 K
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2012-10-23
err16
PREAI
errShuman, Nicholas S.; Friedman, Jeffrey F.; Miller, Thomas M.; Viggiano, A. A.
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err收藏
Dissociative electron attachment to C2F5 radicals
errJOURNAL OF CHEMICAL PHYSICS
IF3.1
err2012-08-03
err17
errOAAI
errHaughey, Sean A.; Field, Thomas A.; Langer, Judith; Shuman, Nicholas S.; Miller, Thomas M.; Friedman, Jeffrey F.; Viggiano, A. A.
err分享
err收藏

研究方向

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合作期刊
H
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H 指数: 110 · 论文数: 841
K
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H 指数: 108 · 论文数: 1.4K
D
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H 指数: 98 · 论文数: 1.0K
G
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H 指数: 87 · 论文数: 538
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