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Shaun T. Lancaster

national institute of chemistry - slovenia
H指数:7
被引数:161

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Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques
2024-12-010
OAAI
Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
2024-01-010
OA