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J

Jonghan Jin

university of science & technology (ust)

23H指数
142论文数
2.9K被引数
收录论文 28
发表时间
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Approaching the Quantum-Limited Precision in Frequency-Comb-Based Spectral Interferometric Ranging (Laser Photonics Rev. 19(11)/2025)接近基于频梳的光谱干涉测距的量子极限精度 (Laser Photonics Rev. 19(11)/2025)
errLaser & Photonics Reviews
IF10
err2025-06-04
err0
PREAI
errYoon-Soo Jang; Heulbi Ahn; Sunghoon Eom; Jungjae Park; Jonghan Jin
err分享
err收藏
Approaching the Quantum-Limited Precision in Frequency-Comb-Based Spectral Interferometric Ranging接近基于频梳的谱干涉测距的量子极限精度
errLASER & PHOTONICS REVIEWS
IF10
err2025-01-28
err0
PREAI
errYoon-Soo Jang; Heulbi Ahn; Sunghoon Eom; Jungjae Park; Jonghan Jin
err分享
err收藏
A Review of Thin-film Thickness Measurements using Optical Methods使用光学方法测量薄膜厚度的综述
errprecision engineering journal of the international societies for precision engineering and nanotechnology
IF3.6
err2024-06-22
err1
PREAI
errPark, Jungjae; Cho, Yong Jai; Chegal, Won; Lee, Joonyoung; Jang, Yoon-Soo; Jin, Jonghan
err分享
err收藏
Thickness measurements and uncertainty evaluation of a multilayer thin-film sample using auxiliary single-layer samples
errMETROLOGIA
IF2.4
err2023-03-07
err5
PREAI
errPark, Jungjae; Bae, Jaeseok; Jang, Yoon-Soo; Jin, Jonghan
err分享
err收藏
Full C-band wavelength-tunable, 250 MHz repetition rate mode-locked polarization-maintaining fiber laser
errSCIENTIFIC REPORTS
IF3.9
err2023-03-03
err9
errOAAI
errJang, Yoon-Soo; Park, Jungjae; Jin, Jonghan
err分享
err收藏
Thickness and refractive index measurements of a thin-film using an artificial neural network algorithm
errMETROLOGIA
IF2.4
err2023-02-13
err7
PREAI
errLee, Joonyoung; Jin, Jonghan
err分享
err收藏
Comb-mode resolved spectral domain interferometer enabled by a broadband electro-optic frequency comb
errPHOTONICS RESEARCH
IF7.2
err2022-12-23
err13
PREAI
errJang, Yoon-Soo; Park, Jungjae; Jin, Jonghan
err分享
err收藏
A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard
errSCIENTIFIC REPORTS
IF3.9
err2022-02-09
err7
errOAAI
errLee, Joonyoung; Jin, Jonghan
err分享
err收藏
Periodic-Error-Free All-Fiber Distance Measurement Method With Photonic Microwave Modulation Toward On-Chip-Based Devices
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2022-01-01
err9
errOAAI
errJang, Yoon-Soo; Park, Jungjae; Jin, Jonghan
err分享
err收藏
Optical method for simultaneous thickness measurements of two layers with a significant thickness difference
errOPTICS EXPRESS
IF3.3
err2021-09-17
err17
errOAAI
errBae, Jaeseok; Park, Jungjae; Ahn, Heulbi; Jin, Jonghan
err分享
err收藏
Sub-100-nm precision distance measurement by means of all-fiber photonic microwave mixing
errOPTICS EXPRESS
IF3.3
err2021-04-05
err12
errOAAI
errJang, Yoon-Soo; Park, Jungjae; Jin, Jonghan
err分享
err收藏
Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range
errOPTICS EXPRESS
IF3.3
err2019-08-15
err17
errOAAI
errPark, Jungjae; Mori, Hiroki; Jin, Jonghan
err分享
err收藏
A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices
errSCIENTIFIC REPORTS
IF3.9
err2018-10-26
err12
errOAAI
errAhn, Heulbi; Bae, Jaeseok; Park, Jungjae; Jin, Jonghan
err分享
err收藏
Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method
errMEASUREMENT
IF5.6
err2018-03-01
err8
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb
errOPTICS EXPRESS
IF3.3
err2017-05-22
err27
errOAAI
errBae, Jaeseok; Park, Jungjae; Ahn, Heulbi; Jin, Jonghan
err分享
err收藏
Absolute distance measurement method without a non-measurable range and directional ambiguity based on the spectral-domain interferometer using the optical comb of the femtosecond pulse laser
errAPPLIED PHYSICS LETTERS
IF3.6
err2016-12-16
err25
errOAAI
errPark, J.; Jin, J.; Kim, J. -A.; Kim, J. W.
err分享
err收藏
Optical Fiber-Based Confocal and Interferometric System for Measuring the Depth and Diameter of Through Silicon Vias基于光纤的共焦和干涉测量系统，用于测量硅通孔的深度和直径
errJOURNAL OF LIGHTWAVE TECHNOLOGY
IF4.8
err2016-12-01
err12
PREAI
errAhn, Heulbi; Park, Jungjae; Kim, Jong-Ahn; Jin, Jonghan
err分享
err收藏
Absolute angle measurement using a phase-encoded binary graduated disk
errMEASUREMENT
IF5.6
err2016-02-01
err51
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Vibration-insensitive measurements of the thickness profile of large glass panels
errOPTICS EXPRESS
IF3.3
err2015-12-14
err33
errOAAI
errPark, Jungjae; Bae, Jaeseok; Jin, Jonghan; Kim, Jong-Ahn; Kim, Jae Wan
err分享
err收藏
An optical straightness measurement sensor for the KRISS watt balance
errMEASUREMENT
IF5.6
err2015-02-01
err5
PREAI
errKang, Chu-Shik; Kim, Jong-Ahn; Jin, Jonghan; Eom, Tae Bong; Kim, Jae Wan
err分享
err收藏

研究方向

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合作学者
合作期刊
S
Seung‐Woo Kim
H 指数: 58 · 论文数: 727
Y
Young‐Jin Kim
H 指数: 53 · 论文数: 742
Y
Yunseok Kim
H 指数: 49 · 论文数: 316
S
Sunghun Lee
H 指数: 31 · 论文数: 167
H
Hiroki Mori
H 指数: 28 · 论文数: 193
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