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收藏Mechanisms of the Device Property Alteration Generated by the Proton Irradiation in GaN-Based MIS-HEMTs Using Extremely Thin Gate Insulator
Chang, Sung-Jae; Kim, Dong-Seok; Kim, Tae-Woo; Bae, Youngho; Jung, Hyun-Wook; Choi, Il-Gyu; Noh, Youn-Sub; Lee, Sang-Heung; Kim, Seong-Il; Ahn, Ho-Kyun; Kang, Dong-Min; Lim, Jong-Won
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收藏Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer
Chang, Sung-Jae; Kim, Dong-Seok; Kim, Tae-Woo; Lee, Jung-Hee; Bae, Youngho; Jung, Hyun-Wook; Kang, Soo Cheol; Kim, Haecheon; Noh, Youn-Sub; Lee, Sang-Heung; Kim, Seong-Il; Ahn, Ho-Kyun; Lim, Jong-Won
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