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Teodor Gotszalk

Faculty of Electronics

28H指数
295论文数
3.4K被引数
收录论文 51
发表时间
Magnetic field sensing of 3D printed Halbach arrays3D打印哈尔巴赫阵列的磁场传感
err2025-12-13
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errOAAI
errAigerim Ospanova; Alisher Konysbekov; Bartosz Pruchnik; Piotr Putek; Teodor Gotszalk; Andrzej Dziedzic; Grant Ellis; Piotr Skrzypacz
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Characterization of a hybrid nanowire-MEMS force sensor using direct actuation使用直接驱动对混合纳米线-MEMS力传感器的表征
err2025-07-22
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PREAI
errBartosz Pruchnik; Krzysztof Kwoka; Tomasz Piasecki; Masoud Jedari Ghourichaei; Umut Kerimzade; Onur Aydin; Bekir Aksoy; Cemal Aydogan; Gokhan Nadar; Ivo W Rangelow; Arda Deniz Yalcinkaya; Halil Bayraktar; Burhanettin Erdem Alaca; Teodor Gotszalk
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Multiscale Fabrication and Characterization of a NEMS Force Sensor
err2024-08-31
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errOAAI
errJedari Ghourichaei, Masoud; Kerimzade, Umut; Demirkazik, Levent; Pruchnik, Bartosz; Kwoka, Krzysztof; Badura, Dominik; Piasecki, Tomasz; Toymus, Alp Timucin; Aydin, Onur; Aksoy, Bekir; Aydogan, Cemal; Nadar, Gokhan; Rangelow, Ivo W.; Beker, Levent; Yalcinkaya, Arda Deniz; Bayraktar, Halil; Gotszalk, Teodor; Alaca, Burhanettin Erdem
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Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties
errSENSORS
IF3.5
err2024-08-30
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errOAAI
errSikora, Andrzej; Gajewski, Krzysztof; Badura, Dominik; Pruchnik, Bartosz; Piasecki, Tomasz; Raczkowski, Kamil; Gotszalk, Teodor
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Fabrication of focused ion beam-deposited nanowire probes for conductive atomic force microscopy
err2024-07-01
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errOAAI
errGacka, Ewelina; Pruchnik, Bartosz; Tamulewicz-Szwajkowska, Magdalena; Badura, Dominik; Rangelow, Ivo W.; Gotszalk, Teodor
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Wavelet-based information theory in quantitative assessment of AFM images' quality
err2024-02-18
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errOAAI
errPruchnik, Bartosz Czeslaw; Putek, Piotr Adam; Gotszalk, Teodor Pawel
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QEchemMEMS - A working electrode with high-resolution temperature sensing for studying electrochemical heat management systems
err2024-02-01
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PREAI
errPruchnik, Julia; Piasecki, Tomasz; Pruchnik, Bartosz; Prokaryn, Piotr; Dobrowolski, Rafal; Sierakowski, Andrzej; Gotszalk, Teodor
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Four-Point Measurement Setup for Correlative Microscopy of Nanowires用于纳米线相关显微镜的四点测量装置
err2023-08-30
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errOAAI
errPruchnik, Bartosz C.; Fidelus, Janusz D.; Gacka, Ewelina; Kwoka, Krzysztof; Pruchnik, Julia; Piejko, Adrianna; Usydus, Lukasz; Zaraska, Leszek; Sulka, Grzegorz D.; Piasecki, Tomasz; Gotszalk, Teodor P.
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Synergistic Effect of Precursor and Interface Engineering Enables High Efficiencies in FAPbI3 Perovskite Solar Cells前驱体和界面工程的协同效应可实现FAPbI3钙钛矿太阳能电池的高效率
err2023-07-30
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errOAAI
errSahayaraj, Sylvester; Starowicz, Zbigniew; Ziolek, Marcin; Socha, Robert; Major, Lukasz; Goral, Anna; Gawlinska-Necek, Katarzyna; Palewicz, Marcin; Sikora, Andrzej; Piasecki, Tomasz; Gotszalk, Teodor; Lipinski, Marek
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Impedance spectroscopy of electrostatically driven MEMS resonators静电驱动MEMS谐振器的阻抗谱
err2023-06-01
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PREAI
errKwoka, Krzysztof; Piasecki, Tomasz; Orlowska, Karolina; Grabarczyk, Paulina; Sierakowski, Andrzej; Gotszalk, Teodor; Gacka, Ewelina; Piejko, Adrianna; Gajewski, Krzysztof
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Correlation between Friction and Wear in Cylindrical Anchorages Simulated with Wear Machine and Analyzed with Scanning Probe and Electron Microscope
err2023-02-28
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errOAAI
errDabrowa, Tomasz; Badura, Dominik; Pruchnik, Bartosz; Gacka, Ewelina; Kopczynski, Wladyslaw; Mikulewicz, Marcin; Gotszalk, Teodor; Kijak, Edward
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Microcantilever-based current balance for precise measurement of the photon force
err2023-01-10
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errOAAI
errPruchnik, Bartosz; Orlowska, Karolina; Swiadkowski, Bartosz; Gacka, Ewelina; Sierakowski, Andrzej; Janus, Pawel; Gotszalk, Teodor
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Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy (vol 188, 110373, 2022)
err2022-03-01
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PREAI
errGacka, Ewelina; Kunicki, Piotr; Sikora, Andrzej; Bogdanowicz, Robert; Ficek, Mateusz; Gotszalk, Teodor; Rangelow, Ivo W.; Kwoka, Krzysztof
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Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
err2022-01-01
err8
errOAAI
errGacka, Ewelina; Kunicki, Piotr; Sikora, Andrzej; Bogdanowicz, Robert; Ficek, Mateusz; Gotszalk, Teodor; Rangelow, Ivo W.; Kwoka, Krzysztof
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Stable Field Electron Emission and Plasma Illumination from Boron and Nitrogen Co-Doped Edge-Rich Diamond-Enhanced Carbon Nanowalls硼和氮共掺杂边缘富金刚石增强碳纳米壁的稳定场电子发射和等离子体照明
err2021-09-16
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PREAI
errFicek, Mateusz; Dec, Bartlomiej; Sankaran, Kamatchi Jothiramalingam; Gajewski, Krzysztof; Tatarczak, Piotr; Wlasny, Igor; Wysmolek, Andrzej; Haenen, Ken; Gotszalk, Teodor; Bogdanowicz, Robert
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Advanced Scanning Probe Nanolithography Using GaN Nanowires使用GaN纳米线的高级扫描探针纳米光刻
err2021-06-30
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PREAI
errBehzadirad, Mahmoud; Mecholdt, Stephan; Randall, John N.; Ballard, Joshua B.; Owen, James; Rishinaramangalam, Ashwin K.; Reum, Alexander; Gotszalk, Teodor; Feezell, Daniel F.; Rangelow, Ivo W.; Busani, Tito
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Hierarchical approach for the rational construction of helix-containing nanofibrils using α,β-peptides使用 α,β-肽合理构建含螺旋纳米纤维的分层方法
err2021-01-01
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errOAAI
errSzefczyk, Monika; Szulc, Natalia; Gasior-Glogowska, Marlena; Modrak-Wojcik, Anna; Bzowska, Agnieszka; Majstrzyk, Wojciech; Taube, Michal; Kozak, Maciej; Gotszalk, Teodor; Rudzinska-Szostak, Ewa; Berlicki, Lukasz
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The Application of Impedance Spectroscopy for Pseudomonas Biofilm Monitoring during Phage Infection
err2020-04-07
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errOAAI
errGula, Grzegorz; Szymanowska, Paulina; Piasecki, Tomasz; Goras, Sylwia; Gotszalk, Teodor; Drulis-Kawa, Zuzanna
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