Russell Duane - Publications, H-index & Citations

Russell Duane

varadis, site 13 carrigaline industrial park, carrigaline, p43 dc53 cork, ireland

12H指数

65论文数

590被引数

收录论文 10

发表时间

Characterization of a 100 nm RADFET as a Proton Beam Detector 100 nm RADFET作为质子束探测器的表征

Sensors 2026, Vol. 26, Page 202

IF3.5

2025-12-28

OAAI

J. A. Moreno-Pérez; I. Ruiz-García; R. Duane; P. Martín-Holgado; L. Morvaj; N. Vasovic; W. Hajdas; Y. Morilla; M. A. Carvajal

Identification of the transient stress-induced leakage current in silicon dioxide films for use in microelectromechanical systems capacitive switches

APPLIED PHYSICS LETTERS

IF3.6

2015-04-29

OAAI

Ryan, C.; Olszewski, Z.; Houlihan, R.; O'Mahony, C.; Blake, A.; Duane, R.

A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches

APPLIED PHYSICS LETTERS

IF3.6

2014-02-12

OAAI

Ryan, C.; Olszewski, Z.; Houlihan, R.; O'Mahony, C.; Duane, R.

Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals

LAB ON A CHIP

IF5.4

2013-01-01

PREAI

Arima, Valentina; Pascali, Giancarlo; Lade, Oliver; Kretschmer, Hans R.; Bernsdorf, Ingo; Hammond, Victoria; Watts, Paul; De Leonardis, Francesco; Tarn, Mark D.; Pamme, Nicole; Cvetkovic, Benjamin Z.; Dittrich, Petra S.; Vasovic, Nikola; Duane, Russell; Jaksic, Aleksandar; Zacheo, Antonella; Zizzari, Alessandra; Marra, Lucia; Perrone, Elisabetta; Salvadori, Piero A.; Rinaldi, Rosaria

Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches

APPLIED PHYSICS LETTERS

IF3.6

2012-06-06

OAAI

Olszewski, Z.; Houlihan, R.; Ryan, C.; O'Mahony, C.; Duane, R.

Addendum: 'A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches' (vol 93, 094101, 2008)

APPLIED PHYSICS LETTERS

IF3.6

2012-02-09

OAAI

Olszewski, Zbigniew; Houlihan, Ruth; O'Mahony, Conor; Duane, Russell